D8 ADVANCE
The D8 ADVANCE: A single solution for XRD, PDF and SAXS
D8 ADVANCE – the future-proof solution in X-ray diffraction
The D8 ADVANCE is based on the unique D8 diffractometer family platform and is perfectly designed for all X-ray powder diffraction and scattering applications including:
- traditional X-ray powder diffraction (XRD)
- Pair Distribution Function (PDF)analysis
- Small and Wide Angle X-ray Scattering (SAXS, WAXS)
Due to its superb adaptability, the D8 ADVANCE has the ability to measure all sample types, from liquids to loose powders, from thin films to solid blocks, on a single instrument.
No matter if you are a novice or an expert user, configuration changes are quick, easy and fool-proof. All of this is made possible by Bruker's unique DAVINCI.DESIGN: Tool- and alignment-free changes of the instrument configuration, supported by automatic, real-time component recognition and validation.
Even more - only Bruker offers an alignment guarantee based on the NIST standard reference material SRM1976. There is no other powder diffractometer on the market exceeding the accuracy of a D8 ADVANCE in terms of peak positions, intensities, and resolution.
Market Gallery
Key Features
TWIN / TWIN optics
The patented TWIN / TWIN optics beam path design greatly simplifies the usage of the D8 ADVANCE, allowing a large variety of applications and sample types. With user convenience in mind, the system features automatic, motorized switching between 4 different beam geometries. Without manual user intervention, the system is capable of switching between focusing Bragg-Brentano for powders and parallel-beam geometry for ill-shaped samples, coatings, and thin films and everything in-between. It is perfectly suited for all sample types including powder, bulk, fiber, sheet and thin-film (amorphous, polycrystalline and epitaxial) under ambient or non-ambient conditions.
Dynamic Beam Optimization™ (DBO)
Bruker's unique DBO feature sets a significant new benchmark in terms of data quality for X-ray diffraction. The automatic synchronization of motorized divergence slits, a motorized anti-scatter screen, and the variable field-of-view active detector window provides unparalleled data quality, specifically at low angles 2Ɵ. DBO is supported by all members of the LYNXEYE detector family: SSD160-2, LYNXEYE-2, and LYNXEYE XE-T.
LYNXEYE XE-T
The LYNXEYE XE-T is the flagship within the LYNXEYE family of detectors. The LYNXEYE XE-T is the only energy dispersive detector on the market for acquisition of 0D, 1D and 2D data. Suited for all wavelengths (from Cr to Ag), with highest count rate capability and best angular resolution, the detector is ideal for all X-ray diffraction and scattering applications.
The superb energy resolution of the LYNXEYE XE-T, better than 380 eV, makes it the highest performing detector system on the market in terms of fluorescence filtering. With the LYNXEYE XE-T detector Fe fluorecense excited by Cu radiation is filtered 100% at zero intensity loss and there is no need for metal filters causing artifacts in the data such as remnant Kß and absorption edges. Also there is no more need for intensity-killing secondary monochromators.
The LYNXEYE XE-T is covered by Brukers unique detector warranty: No defective channels at delivery time. Guaranteed!
Feature Gallery
EIGER2 R family of detectors
Instrument and Data Quality
One Diffractometer - All Applications
Powder Diffraction
X-ray powder diffraction (XRPD) techniques are among the most important tools for materials characterization. Much of the information embedded in a powder pattern is derived directly from the atomic arrangement of the phases present. The D8 ADVANCE and the DIFFRAC.SUITE software allow support simple execution of common XRPD methods:
- Identification of both crystalline and amorphous phases and determination of specimen purity
- Quantitative analysis of both crystalline and amorphous phases in multi-phase mixtures
- Microstructure analysis (crystallite size, microstrain, disorder…)
- Bulk residual stress resulting from thermal treatment or machining in manufactured components
- Texture (preferred orientation) analysis
- Indexing, ab-initio crystal structure determination and crystal structure refinement
Pair Distribution Function Analysis
Pair distribution function (PDF) analysis is an analytical technique that provides structural information from disordered materials based on Bragg as well as diffuse scattering ("Total Scattering"). While Bragg peaks provide information about the average crystal structure of a material (i.e. long range order), diffuse scattering allows characterization of its local structure (i.e. short range order).
The D8 ADVANCE and TOPAS software represent the highest performing PDF analysis solutions on the market in terms of analysis speed, data quality and results for analysis of amorphous, poorly crystalline, nano-crystalline or nano-structured materials:
- Phase identification
- Structure determination and refinement
- Nano particle size and shape
Thin Films and Coatings
Analysis of thin films and coatings is based on the same principles of XRPD, but with further beam conditioning and angular control. Typical examples include, but are not limited to, phase identification, crystalline quality, residual stress, texture analysis, thickness determination and composition vs strain analysis. Analysis of thin films and coatings is focusing on properties of layered materials with nm to µm thickness, ranging from amorphous and poly-crystalline coatings to epitaxially grown films. The D8 ADVANCE and the DIFFRAC.SUITE software enable high quality analyses of thin films including:
- Grazing incidence diffraction
- X-Ray Reflectometry
- High resolution X-ray diffraction
- Reciprocal space mapping
Application Gallery
D8 ADVANCE Specifications
Feature |
Specification |
Benefit |
TRIO and TWIN optics |
Software push-button switch between: Motorized Divergence Slit (Bragg-Brentano) High Intensity Ka1,2 Parallel Beam High Resolution Ka1 Parallel Beam Patents: US10429326, US6665372, US7983389 |
Fully automatic, motorized switching between up to 6 different beam geometries without any manual user intervention Perfectly suited for all sample types including powders, bulk materials, fibers, sheets and thin-films (amorphous, polycrystalline and epitaxial) |
Dynamic Beam Optimization |
Dynamic synchronization of: motorized divergence slits motorized anti-scatter screen variable active detector window 2Ɵ Angular range: <1 to >150 |
Data virtually free of air, instrument, and sample support scattering Significantly enhanced lower limits of detection enabling quantification for minor crystalline and amorphous phases Unparalleled performance at low 2Ɵ angles enabling accurate investigations of clays, pharmaceuticals, zeolites, porous framework materials and more |
LYNXEYE XE-T |
Energy Resolution: < 380 eV @ 8 KeV Detection Modes: 0D,1D, 2D Wavelengths: Cr, Co, Cu, Mo and Ag Patents: EP1647840, EP1510811, US20200033275 |
No need for Kß filters and secondary monochromators 100% filtering of Fe-fluorescense with Cu radiation Up to 450 times faster than conventional detector systems BRAGG2D: Collect 2D data with a divergent primary line beam Unique detector warranty: No defective channels at delivery time |
EIGER2 R |
The latest generation multi-mode (0D/1D/2D) detector based on the Hybrid Photon Counting technology, developed by Dectris Ltd. |
Seamless integration of 0D, 1D and 2D detection in step, continuous and advanced scanning modes Ergonomic, alignment-free detector rotation to optimize γ or 2Ɵ angular coverage Panoramic, tool-free diffracted beam optics using the complete detector field of view Continuously variable detector positioning to balance angular coverage and resolution |
TWIST.TUBE |
Easy, fast, and alignment-free switch between line and point focus applications |
No disconnecting of electric cables or water hoses or unmounting of tubes DAVINCI.DESIGN: Fully automatic detection and configuration of the focus orientation |
Sample Changers |
FLIPSTICK: 9 Samples AUTOCHANGER: 90 samples |
Operation in reflection AND transmission geometries |
D8 Goniometer |
Two-circle goniometer with independent stepper motors and optical encoders |
Unparalleled accuracy and precision as manifasted by Bruker's unique alignment guarantee Absolutely maintenance free drive mechanism / gearings with lifetime lubrication |
Non-ambient |
Temperature: Ranging from ~85K up to ~2500K Pressure: 10-⁴ mbar up to 10 bar Humidity: 5% to 95% RH |
Investigations under ambient and non-ambient conditions Easily exchanged stages with DIFFRAC.DAVINCI |
XRD Components
Bruker XRD solutions consist of high performance components configured to meet the analytical requirements. The modular design is the key to configure the best instrumentation.
All categories of components are part of Bruker’s key competence, developed and manufactured by Bruker AXS, or in close cooperation with third party vendors.
Bruker XRD components are available for upgrading the installed X-ray systems for improving their performance.
PLAN.MEASURE.ANALYZE with DIFFRAC.SUITE
DIFFRAC.SUITE™ offers a wide range of software modules for easy X-ray powder diffraction data acquisition and evaluation. Based on Microsoft's .NET technology, DIFFRAC.SUITE offers all the advantages of modern software technology for stability, maximum ease of use and networking.
The fully customizable user-interface is characterized by a plug-in framework, providing a common look, feel and operation. All measurement and evaluation software modules can be operated as individual applications or integrated together in DIFFRAC.SUITE's plug-in framework. Unlimited networking allows access and control of any number of D2 PHASER, D8 ADVANCE, D8 DISCOVER and D8 ENDEAVOR diffractometers within a customer's network.
Measurement Software:
WIZARD – Method planning
COMMANDER – Method execution and direct measurements
TOOLS – Service Interface
Powder Diffraction Software:
DQUANT – Quantitative phase analysis
EVA – Phase identification and quantitative phase analysis
TOPAS – Profile analysis, quantitative analysis, structure analysis
Materials Research Software:
SAXS – Small Angle X-ray Scattering software
XRR – Comprehensive X-ray reflectometry analysis
TEXTURE – All-round Texture analysis meets ease-of-use
LEPTOS – Thin film analysis/Residual stress investigation
Webinars
D8 ADVANCE Resources
Brochures & Flyers
Service & Support
- Helpdesk for technical issues with hardware, software, and applications support using web based and advanced remote service tools.
- LabScape Maintenance Service Agreements
- On-site, on-demand support
- Installation and operational qualification as well as performance verification
- Site planning, relocation, and consultation
- Replacement and spare parts, consumables, and in-person and online training
- Software updates, manuals, and LabScape MSA management (↗brukersupport.com)