AFM Training Courses in North America
AFM Image Quality and PeakForce QNM™ Course
In this class, we will talk about image quality and PeakForceTM Quantitative Nanomechanical Mapping (QNM).
- Day 1: Image Quality will cover in-depth theory of contact mode, TappingMode, and PeakForce Tapping with ScanAsyst, along with a discussion on the advantages and disadvantages of each mode. This session will include instruction on how to optimize the AFM scanning parameters to improve image quality. This session will discuss common imaging artifacts; how to recognize artifacts and prevent them.
- Day 2: PeakForce QNM and PeakForce QNM High Accuracy will discuss the theory, procedure, and offline analysis of force curves, including various contact mechanics theories for material modulus measurement with AFM. This session also includes PeakForce QNM theory, detailed quanitative nanomechanical mapping calibration procedures, and techniques for improving PeakForce QNM accuracy.
- Day 3: Imaging in Fluid and PeakForce QNM in Fluid will talk about how to setup typical fluid experiments, and how to calibrate PeakForce QNM parameters in fluid.
- Optional: Upon request, you may also stay on Friday to have more hands-on practice.
Cost: $2500/person. Free and discounted seats available to some service contract customers.*
Conditions: Daily lunches provided. Individuals are responsible for their own transportation and lodging.
*Two free seats for Complete Care service contract customers. One free seat for Access Care customers.
Date: May 13-15, 2025
Location: Billerica, MA, USA
Cost: $2500/person*
AFM Electrical Measurements Course
During this 3-day course you can improve your skillset and understanding of common electrical modes used on Bruker AFMs. This training will focus on using the Icon AFM for practical work, but the principals and software operation are the same as for electrical measurements using Brukers Multimode AFM.
This class is focused on electrical property measurements of materials using atomic force microscopy.
- Day 1: Tunneling Current AFM (TUNA) and Piezo Response Force Microscopy (PFM)
- Day 2: Scanning Capacitance Microscopy (SCM) and Kelvin Probe Force Microscopy (KPFM)
- Day 3: Kelvin Probe Force Microscopy (continued)
- Optional: Upon request, you may also stay on Friday to have more hands-on practice.
Four different techniques will be discussed: Tunneling Current AFM (TUNA), Piezo Response Force Microscopy (PFM), Scanning Capacitance Microscopy (SCM), and Kelvin Probe Force Microscopy (KPFM). TUNA can measure material’s electrical conductivity with wide range of current from fA-uA. PFM is used to study piezo material on nanoscale. SCM is one of the primary techniques for doping profile mapping in semiconductor industry. KPFM measures material work function as well as surface charge.
Cost: $2500/person. Free and discounted seats available to some service contract customers.*
Conditions: Daily lunches provided. Individuals are responsible for their own transportation and lodging.
*Two free seats for Complete Care service contract customers. One free seat for Access Care customers.
Date: July 15-17, 2025
Location: Santa Barbara, CA, USA
Cost: $2500/person*
AFM Biological Applications Course
During this training you can improve your skillset and understanding of AFM measurements for biological applications on Bruker AFMs.
- Day 1: Cell Imaging
- Day 2: Mechanical Property Measurement
- Day 3: DNA Imaging
- Optional: Upon request, you may also stay on Friday to have more hands-on practice.
Cost: $2500/person. Free and discounted seats available to some service contract customers.*
Conditions: Daily lunches provided. Individuals are responsible for their own transportation and lodging.
*Two free seats for Complete Care service contract customers. One free seat for Access Care customers.
Date: September 16-18, 2025
Location: Billerica, MA, USA
Cost: $2500/person*
Combining AFM with Nanoscale IR Course
Bruker’s IconIR and nanoIR systems combine nanoscale IR spectroscopy and AFM onto one platform to deliver the most advanced spectroscopy and property mapping capabilities to both academic and industrial users. In this class, we will focus on understanding the AFM-IR theory and operations. We will discuss how to detect IR absorption using the AFM technique, how to set up AFM-IR detection parameters and how to optimize signals for collecting IR spectra and chemical images.
The class includes both theory sessions and lab sessions. In the lab sessions, students can practice each technique on Bruker’s latest Dimension IconIR and nanoIR3 systems. During this training you can improve your skillset and understanding of AFM-IR measurements on Bruker AFMs.
- Day 1: Contact AFM-IR
- Day 2: Tapping AFM-IR
- Day 3: Surface Sensitive Mode, s-SNOM (on nanoIR3) and Resonance Enhanced Force Volume (on IconIR)
- Optional: Upon request, you may also stay on Friday to have more hands-on practice.
Cost: $2500/person. Free and discounted seats available to some service contract customers.*
Conditions: Daily lunches provided. Individuals are responsible for their own transportation and lodging.
*Two free seats for Complete Care service contract customers. One free seat for Access Care customers.
Date: November 11-13, 2025
Location: Santa Barbara, CA, USA
Cost: $2500/person*
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You can email us with more information at productinfo@bruker.com.
If you would like to connect with a Bruker representative immediately, here are our regional offices:
Asia: +65 6540 4388
China: +86 10 5833 3000
Europe: +33 172 86 61 00
Japan: +81 3 3523-6361
North America: +1 805-967-1400
