Optimal Sample Preparation for Large-Area Transmission Kikuchi Diffraction Analysis
Sample Preparation for Large-Area On-Axis TKD Analysis
Curious about optimum sample preparation of nanomaterials? Join us for this insightful webinar presented by Dr. Pawel Nowakowski, Senior Applications Scientist at Fischione Instruments (USA), and Dr. Laurie Palasse, Global Application Manager at Bruker Nano Analytics (Germany) to learn about the latest advancements in on-axis TKD and sample preparation techniques for large-area analysis.
In this webinar, you will learn the advantages of a post-focused ion beam (FIB) sample preparation technique. This technique employs a concentrated argon ion beam milling system that meets the sample requirement challenges of large-area and thickness uniformity for optimal transmission Kikuchi diffraction (TKD) analysis. Following argon ion milling preparation, the samples are free of structural damage and amorphization.
We will review:
- The advantages of on-axis TKD technique for crystallographic orientation mapping of nanomaterials in the SEM
- How TKD provides quantitative and qualitative data on the crystallographic orientation down to 2nm spatial resolution
- How this technique can reveal the structural and functional properties of materials.
Who Should Attend?
- All users interested in characterization of nanostructured materials.
- Researchers and specialists interested in dark field and bright field imaging, as well as orientation mapping at the nanoscale.
- FIB/SEM microscopists interested in advanced sample preparation and analytical techniques
In Cooperation with
Speakers
Dr. Pawel Nowakowski
Senior Application Scientist, E.A. Fischione Instruments, Inc.
Dr. Laurie Palasse
Global Application Manager, Bruker Nano Analytics
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