In-Situ Tensile Testing in the TEM and SEM with Hysitron Picoindenters

Join us for a two-hour seminar, led by experts in the field, to discuss in-situ tensile testing in the transmission and scanning electron microscopes.

Seminar Overview

The tensile test is the standard mechanical test for determining Young’s modulus, yield strength, work hardening, and more. These tests are more challenging than their peers to perform at nano- and micromechanical length scales, requiring advanced sample preparation and positioning. In 2006, researchers using Bruker’s Hysitron Picoindenter tools were the first to enable in-situ quantitative testing, originally in the TEM, followed shortly in the SEM. Indentation,¹ compression, and tensile modes^2,3 as standard on the original Hysitron PI 95 led to a wave of in-situ publications. In this seminar, the focus is on re-creating a uniaxial strain using both direct pull² with tensile actuation of the transducer, and the patented Push-to-Pull MEMS chip.³

We welcome these experts to present data from the past, present, and future of in-situ tensile testing in the SEM and TEM.

Presentations

In-Situ Tensile Testing in a TEM: Both Measuring and Observing Changes in Local Structure
Presenter: Prof. Andrew Minor

In-Situ TEM Failures in Fatigue and Other Extreme Environments
Presenter: Dr. Khalid Hattar

A Practical Demonstration of In-Situ SEM Direct Pull Tension: Step-by-Step Sample Preparation and Testing of a Duplex Steel
Presenter: Dr. Eric Hintsala

Referenced Papers

1. A new view of the onset of plasticity during the nanoindentation of aluminium. Minor, A.M., Asif, S.A.S., Shan, Z.W., Stach, E.A., Cyrankowski, E.C., Wyrobek, T., Warren, O.L. Nature Materials 5 697-702 (2006).
2. Source Truncation and Exhaustion: Insights from Quantitative in situ TEM Tensile Testing. Kiener, D. and Minor, A.M. Nano Letters 11, 9, 3816–3820 (2011).
3. Mechanics and Dynamics of the Strain-Induced M1-M2 Structural Phase Transition in Individual VO₂ Nanowires. Guo, H. Chen, K., Oh, Y., Wang, K. Dejoie, C., Asif, S.A.S., Warren, O.L., Shan, Z.W., Wu, J. and Minor, A.M. Nano Letters 11, 3207-3213, (2011).