D8 DISCOVER Plus
XRD beyond expectations
The D8 DISCOVER Plus is the most powerful and versatile X-ray diffractometer on the market.
Core is the high-accuracy ATLAS goniometer that hosts the high-efficiency Turbo X-ray source (TXS-HE) and the market-leading Non-Coplanar Arm.
It is designed for the structural characterization of the full range of materials from powders, amorphous and polycrystalline materials to epitaxial multi-layered thin films at ambient and non-ambient conditions.
Applications:
- Phase Identification and quantification, structure determination and refinement, Micro strain and crystallite size analysis,
- X-Ray reflectometry, Grazing Incidence Diffraction (GID), In-Plane Diffraction, High-resolution XRD, GISAXS, GI-Stress analysis, crystal orientation analysis
- Residual Stress analysis, Texture and pole figures, micro X-ray Diffraction, Wide Angle X-ray Scattering (WAXS),
- Total scattering analysis: Bragg Diffraction, Pair-Distribution Function (PDF), Small Angle X-Ray Scattering (SAXS)
Market Gallery
Key Features
Non-Coplanar Arm
The D8 DISCOVER Plus can be equipped with the Non-Coplanar Arm to perform In-Plane diffraction measurements with unrivalled performance.
- Accessible 2θ range of up to 160° for unrivalled accuracy in d-spacing determination.
- Unmatched accuracy with direct angular encoder.
- Dedicated beam path components increase the measured intensities to obtain signals even from ultra thin polycrystalline films.
- Seamless integration in DIFFRAC.SUITE software and in DIFFRAC.DAVINCI for maximized efficiency.
ATLAS™ Goniometer
In X-ray diffraction the base for an accurate sample analysis is the goniometer and the precise orientation of the mounted components particularly while measuring. The ATLAS goniometer exactly meets these requirements by design and sets the benchmark for angular and spatial accuracy:
- Robust and maintenance-free goniometer
- High-precision stepper motors with high resolution optical encoders
- Precise and software monitored interfaces for mounting components
The D8 DISCOVER Plus equipped with the ATLAS goniometer comes with a Bruker AXS generic alignment guarantee: the angular deviation ∆2Theta of measured and certified peak positions 2Theta is ≤0.007°. This is verified by measuring the NIST certified standard SRM1976 with each individual instrument.
TXS-HE X-ray Source
Whether the key measure of an analytical X-ray tool is data quality, defined as signal-to-noise or signal-to-background, or sample throughput, one constant is that a more of signal is always an advantage.
The High Efficiency Turbo X-ray Source (TXS-HE) has been designed to boost signal while minimizing maintenance associated with rotating anode technology.
- Up to 5 times the intensity of an industrial sealed tube
- Line focus setup with unsurpassed focal spot brightness of 6 kW/mm2
- Ideal coupling with optics for maximum intensity
- Reduced beam path length to minimize air scatter
ATLAS™ goniometer
Compact UMC Plus 150
PATHFINDER Plus optics
EIGER2 R 500K
MONTEL Plus with dedicated optics
Beyond Premium Class Diffraction
Thin Film Analysis
Coplanar Diffraction
In a coplanar experiment, the source and detector increase their angle relative to the sample surface resulting in a probing direction into the sample surface.
- Grazing Incidence Diffraction (GID) for surface sensitive identification of crystalline phases and determination of their structural properties including crystallite size and strain.
- X-ray reflectometry (XRR) for the extraction of thicknesses, material densities and interface structures in multi-layer samples – from simple substrates to highly complex superlattice structures.
- Grazing Incidence Small Angle X-Ray Scattering (GISAXS)
Non-Coplanar Diffraction
In a non-coplanar experiment, the source and detector angle relative to the sample surface is fixed, with the detector moving in a direction parallel to the sample surface resulting in a probing direction along the sample surface.
- In-Plane Grazing Incidence Diffraction (IPGID) reduces the penetration depth to nm, allowing surface isolation and increase sensitivity to layers with atomic thicknesses.
- Polycrystalline IPGID allows the determination of in-plane crystallite size
- Epitaxial IPGID allows direct determination of in-plane lattice parameters and in-plane orientation.
Materials Research
The ATLAS goniometer increases both the angular and real space positioning accuracy of analyses allowing large scale measurements from miniature areas of the sample. A new class of diffractometer is realized by combining the symmetric divergence IµS with MONTELPlus and multimode EIGER2 R family of detectors, resulting in beam quality and detection capability similar to that found at beamlines.
- Grazing Incidence Diffraction (GID) for surface sensitive Identification of crystalline Phases and determination of their structural properties like crystallite size and strain.
- X-ray reflectometry (XRR) for the extraction of thicknesses, material densities and interface structures in multi-layer samples – from simple substrates to highly complex superlattice structures.
- High-resolution X-ray Diffraction (HRXRD) for the analysis of epitaxial grown sample structures: Layer thickness, strain, relaxation, mosaicity, composition analysis of mixed crystals.
- Stress and Texture (preferred orientation) analysis
- Wide Angle X-ray Scattering (WAXS)
Powder Diffraction
Powder Diffraction (XRPD) covers a wide range of applications on samples with a low degree of orientation. The D8 DISCOVER Plus brings XRPD to a new level of precision with the ATLAS goniometer. By improving the accuracy beyond the industry leading D8 goniometer, XRPD analysis on the D8 DISCOVER Plus allows researchers to uncover minor structural details not previously observed. Equipping the D8 DISCOVER Plus with the TXS-HE allows acquisition of XRPD data over 5x faster than a conventional tube system.
Combined with the powerful DIFFRAC.SUITE software the D8 DISCOVER Plus enables the simple execution of PXRD application like:
- Phase Identification
- Phase Quantification
- Structure Solution
- Pair Distribution Function Analysis (PDF)
- Small Angle X-ray Scattering (SAXS)
Application Gallery
µXRD with 2D detector
In-Plane Diffraction
Reciprocal Space Mapping
D8 DISCOVER Plus Specifications
| Specification | Benefit | |
| TWIST-TUBE | Easy switch between point and line focus Available anodes: Cr, Cu, Mo, Ag Max. Power and filament: up to 3 kW (0,4 x 16 mm²), depending on anode material Patent: EP 1 923 900 B1 |
Quick change of the wavelength to perfectly match different applications Fastest switch between line and point focus for a wider range of applications and better results in shorter time |
| Iµs Microfocus Source | Power load: up to 50 W, single-phase power MONTEL and MONTEL Plus optics combining parallel and focusing mirrors. Beam sizes down to 180 x 180 µm². Maximum integrated flux 8 x 10⁸ cps at mirror exit. Beam divergence down to 0,5 mrad |
Millimeter sized beam with high brilliance and ultra-low background Green design with low power consumption, no water consumption and extended life components Optimize the beam shape and divergence for best results |
| TXS-HE X-Ray Source | Compact and light design for vertical ATLAS goniometer Line focus, 0.3x3 mm² Focal Brigthness of 6 kW/mm² Anode materials: Cu, Co, Cr, Mo Max. voltage 50 kV, max. power depending on anode material: Cr 3.2 kW, Cu/Mo 5.4 kW, Co 2,8 kW Pre-Aligned Tungsten filament |
High flux X-ray source that allows for horizontal sample mounting. Up to 5 times more intensity compared to standard ceramic X-ray sources. Perfectly suited for line and spot focus applications Pre-Aligned filament allow fast filament exchange with a minimum of re-alignment requirement. |
| TRIO Optics | Software push-button switch between: Motorized Divergence Slit (Bragg-Brentano) High Intensity Ka1,2 Parallel Beam High Resolution Ka1 Parallel Beam Patents: US10429326, US6665372, US7983389 |
Fully automatic, motorized switching between up to 6 different beam geometries without any manual user intervention Perfectly suited for all sample types including powders, bulk materials, fibers, sheets and thin-films (amorphous, polycrystalline and epitaxial) |
| High-Resolution Monochromators | Ge(220) and Ge(004) reflections in symmetric and asymmetric geometry 2-bounce and 4-bounce (Bartels type) monochromators Alignment-free mounting through SNAP.LOCK technology |
Broad choice for best resolution vs. intensity balancing to obtain best possible results. Fast exchange of monochromators to optimize to different samples |
| ATLAS™ Goniometer | Vertical goniometer with enforced mechanics designed to host TXS-HE X-ray source Industry leading angular accuracy : ±0.007° 2θ guaranteed over the entire angular range determined on NIST SRM 1976 Seamless integration of D8 family of components, including optics, positioning cameras, sample stage, nonambient and detector technologies |
Unparalleled accuracy and precision as manifested by Bruker's unique alignment guarantee Absolutely maintenance free drive mechanism / gearings with lifetime lubrication Supports the full range of applications to generate highest accuracy data |
| Non-Coplanar Arm | Third goniometer axis for investigating ultra-thin layers and in-plane sample properties: Min. step size: 0.001° Max. 2θ range (depending on the configuration): 160° Automated detector distance detection
|
Unmatched accuracy with direct angular encoder Seamless integration in DIFFRAC.SUITE software Up to 160° 2θ range for most accurate Non-Coplanar structure determination Real-time calibration for EIGER2 detector |
| Compact UMC Stages | Compact UMC Plus 80: Fast spinner for XRPD Max. (x,y) translation: +/- 40 mm Max. sample height: 57 mm
Compact UMC Plus 150: Max. (x,y) translation: +/- 75 mm Max. sample height: 57 mm Vacuum and electric feedthroughs for wafer chuck and tilt stages |
Seamless switching between Thin Film research and Powder diffraction mode 5 position sample changer for 51 mm sample diameter 9 position sample changer for 32 mm sample diameter Mapping of 2-4” wafers
Mapping of 6-8” wafers Reflection mode 96 well plate capability Allows for infinite Phi rotation with connected Tilt-stage and vacuum without a need to care for cables or vacuum pipe. |
| Centric Eulerian Cradle (CEC) | Five degrees of freedom sample stage: x,y for sample translation of +/-40 mm z-Drive for height alignment Phi drive with 360° rotation freedom. Psi drive and angular range from -11° to 98° Max. weight load: 1 kg Various stage attachment available. |
Stress and Texture measurements in side-inclination mode for more accurate results. Automated mapping capability in (x,y). Motorized tilt-stage for precise surface alignment. Powder- or capillary spinners allow for powder diffraction. Bayonet sample stage holder for fast and reproducible swapping with other stages. |
| Pathfinder Plus Optics | Software push-button switch between: Motorized Slit 2-bounce Ge Analyzer Automated absorber integrated |
Fully automatic, motorized switching between two different optics without any manual user intervention. Maintains full field of view of LYNXEYE detectors. Absorber ensures linearity in measured data |
| LYNXEYE XE-T | Energy Resolution: < 380 eV @ 8 KeV Detection Modes: 0D,1D, 2D Wavelengths: Cr, Co, Cu, Mo and Ag Patents: EP1647840, EP1510811, US20200033275 |
No need for Kß filters and secondary monochromators 100% filtering of Fe-fluorescense with Cu radiation Up to 450 times faster than conventional detector systems Bragg2D: Collect 2D data with a divergent primary line beam Unique detector warranty: No defective channels at delivery time |
| EIGER2 | The latest generation multi-mode (0D/1D/2D) detector based on the Hybrid Photon Counting technology, developed by Dectris Ltd. | Seamless integration of 0D, 1D and 2D detection in step, continuous and advanced scanning modes Ergonomic, alignment-free detector rotation to optimize γ or 2Θ angular coverage Panoramic, tool-free diffracted beam optics using the complete detector field of view Continuously variable detector positioning to balance angular coverage and resolution |
| Non-ambient | Temperature: Ranging from ~12 K up to ~2500 K Pressure: 10-⁴ mbar up to 100 bar Humidity: 5% to 95% RH |
Investigations under ambient and non-ambient conditions Easily exchanged stages with DIFFRAC.DAVINCI |
XRD Components
Bruker XRD solutions consist of high performance components configured to meet the analytical requirements. The modular design is the key to configure the best instrumentation.
All categories of components are part of Bruker’s key competence, developed and manufactured by Bruker AXS, or in close cooperation with third party vendors.
Bruker XRD components are available for upgrading the installed X-ray systems for improving their performance.
Webinars
D8 DISCOVER Plus Resources
Brochures & Product Sheets & Flyers
- D8 DISCOVER XRD Solutions for Industry and Research
- Vertical Goniometers for D8 DISCOVER: Setting a Strong Foundation
- Sample Stages for the D8 DISCOVER - Versatile Sample Handling
- D8 DISCOVER Plus - ATLAS™ Goniometer and High Efficiency Turbo X-Ray Source
- Universal Motion Concept and Eulerian Cradles for Controlled Sample Positioning
Application Reports & Webinars
- Characterization of ultra-thin metallic films using incidence diffraction geometries
- D8 DISCOVER Plus, PDF Analysis on Titanium Dioxide Nanoparticles
- D8 DISCOVER Plus, Lower Limits of Detection (LOD) and Quantification (LOQ) for Respirable Silica
- D8 DISCOVER Plus, X-Ray Reflectometry on Thin Films and Superlattices
Service & Support
- Helpdesk for technical issues with hardware, software, and applications support using web based and advanced remote service tools.
- LabScape Maintenance Service Agreements
- On-site, on-demand support
- Installation and operational qualification as well as performance verification
- Site planning, relocation, and consultation
- Replacement and spare parts, consumables, and in-person and online training
- Software updates, manuals, and LabScape MSA management (↗brukersupport.com)