Advanced Nanomechanical Analysis Using Atomic Force Microscopy
Watch this on-demand webinar on advanced nanoscale analysis using AFM
Atomic force microscopy (AFM) is a versatile and valuable tool for nanomechanical characterization of materials. During this webinar, experts answer the following questions:
- Which AFM modes are used for nanomechanical analysis?
- How can you leverage additional tools like machine learning and bulk property analysis?
- How can you correlate nanomechanical measurements with AFM-based nanoelectrical and nanochemical characterization data?
- What details should every user know about experiment setup and data analysis?
Webinar Summary
AFM is a multiparametric imaging technique and ideal for the nanomechanical characterization of advanced materials and the quantification of properties, such as friction, elastic modulus, stiffness, adhesion, and viscoelasticity.
This on-demand webinar:
- Provides an overview of the AFM modes commonly applied in nanomechanical materials research, their advantages and challenges, and examples for each mode;
- Gives examples illustrating the application of computational methods and machine learning algorithms for the detection of different domains and (inter)phases in materials;
- Explains how mechanical properties at the nanoscale can be correlated with bulk material performance;
- Outlines how nanomechanical properties can be correlated with AFM-based nanoelectrical and nanochemical characterization;
- Covers practical aspects, such as selection of the ideal AFM tip & cantilever, and precise quantification via accurate calibration
Find out more about the technology featured in this webinar or our other solutions for nanomechanical analysis using AFM:
Featured Products and Technology
Speaker(s)
Peter De Wolf, Ph.D., Director of Technology & Application Development
Peter De Wolf is director for AFM technology & application development at Bruker Nano Surfaces, covering all applications related to Scanning Probe Microscopy (SPM). He obtained his PhD from IMEC, Belgium on the development of new SPM methods for 2D carrier profiling in semiconductors and has more than 25 years of experience on SPM. He is the author and co-author of over 30 publications related to electrical characterization using SPM. He also owns several SPM patents, and developed several new SPM modes for electrical characterization.
Bede Pittenger, Ph.D., Sr. Staff Development Scientist, AFM Applications, Bruker Nano Surfaces
Dr. Bede Pittenger is a Senior Staff Development Scientist in the AFM Unit of Bruker's Nano Surfaces Business. He received his PhD in Physics from the University of Washington (Seattle, WA) in 2000, but has worked with scanning probe microscopes for 25 years, building systems, developing techniques, and studying properties of materials at the nanoscale. His work includes more than thirty publications and three patents on various techniques and applications of scanning probe microscopy. Dr. Pittenger's interests span topics from interfacial melting of ice, to mechanobiology of cells and tissues, to the nanomechanics of polymers and composites.
Andrea Slade, Ph.D., Product Manager, Materials AFM, Bruker Nano Surfaces & Metrology
Dr. Andrea Slade received her Ph.D. in Biochemistry / Biomedical Engineering from the University of Toronto on the integration of AFM with optical microscopy for the study of biological membranes and membrane-protein interactions. Since joining Bruker in 2005, her work has covered a range of applications and markets, from life science to materials research and semi-conductor industries. Andrea has over 25 years of experience in AFM, numerous peer-reviewed publications, and has given seminars and presentations worldwide.