This webinar focuses on the various possibilities offered by Bruker AFM modes to measure and quantify the properties of dielectric films. Each method is illustrated with case studies, and two short live demonstrations were held on a Bruker Dimension Icon to portray the practical implementation and operation of two of the electrical characterization modes.
The properties of dielectric materials play a crucial role in their suitability for a range of high-performance applications in the semiconductor and microelectronic industries, and as insulation and packaging materials.
In this webinar, the presenters illustrate how AFM can be applied to measure and quantify the properties of dielectric films using:
Each method was illustrated with case studies, and two short live demonstrations were held on a Bruker Dimension Icon to illustrate the practical implementation and operation of two of the electrical characterization modes.
Find out more about the technology featured in this webinar or our other solutions for AFM:
Peter De Wolf, Ph.D.,
Director of Technology & Application Development
Peter De Wolf is director for AFM technology & application development at Bruker Nano Surfaces, covering all applications related to Scanning Probe Microscopy (SPM). He obtained his PhD from IMEC, Belgium on the development of new SPM methods for 2D carrier profiling in semiconductors and has more than 25 years of experience on SPM. He is the author and co-author of over 30 publications related to electrical characterization using SPM. He also owns several SPM patents, and developed several new SPM modes for electrical characterization.
Mickael Febvre, Ph.D.
Application Manager, Bruker EMEA
Andrea Slade, Ph.D., Product Manager, Materials AFM, Bruker Nano Surfaces & Metrology