European AFM User Meeting

For more information about the products, techniques, and technology featured in this event — or any of our other advanced AFM solutions — please contact us:

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:23] NanoScope 6 for PeakForce Tapping
• [00:02:28] Datacube Approach
• [00:04:41] AFM-nDMA
• [00:06:26] SS-PFM
• [00:09:19] sMIM
• [00:10:39] External Magnetic Field Module
• [00:11:46] Dimension IconIR

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:00] Introduction
• [00:01:07] What are Nitride High Electron Mobility Transistors
• [00:09:23] Applying Scanning Probe Microscopy
• [00:12:26] SCM Examples
• [00:16:16] SCM Phase Images
• [00:18:27] Do Surface Defects Alter the 2DEG?
• [00:23:30] Conclusions
• [00:25:41] Q&A

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:00] Introduction & Outline
• [00:02:52] Dynamics of Mineral-Fluid Interactions
• [00:15:09] Atomically Resolved Surface Structures
• [00:17:47] Nanomechanical Measurements
• [00:18:49] Conclusions
• [00:20:05] Q&A

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:00] Introduction & Outline
• [00:01:14] Fuel Cell & Electrolyzer Theory
• [00:05:44] Analysis of Ionomer in Model Systems
• [00:08:25] Analysis of Fuel Cell & Electrolysis Components
• [00:16:45] Conclusions
• [00:17:29] Q&A

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:00] Introduction & Background
• [00:04:08] Features for Open Architecture: Signal Access Module, Virtual SAM, dll-Macro Scripting, and COM-Scripting
• [00:07:00] Demo: Instrument Control with Python

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:00] Introduction & Background
• [00:01:13] Network Polymer Interphases & The AFM-IR Technique
• [00:07:53] The Model System & Iron Oxide Composite Specimens
• [00:16:47] The Fate of Partially Reacted Material
• [00:20:07] Conclusions
• [00:21:40] Q&A

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:00] Introduction & Background
• [00:02:40] Microelectronic Systems Today
• [00:08:09] Scanning Capacitance Microscopy (SCM)
• [00:14:32] Scanning Spreading Resistance Microscopy (SSRM) 
• [00:17:30] Scanning Microwave Impedance Microscopy (sMIM)
• [00:20:52] Conclusions

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:00] Introduction & Background
• [00:01:30] Properties & Challenges of Wood Materials
• [00:07:41] Adhesion Forces on Wood Surfaces
• [00:12:36] PeakForce Infrared Microscopy (PFIR)
• [00:13:42] Scanning Thermal Microscopy (SThM)
• [00:14:46] Conclusions

• [00:15:35] Q&A

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:00] Introduction & Dimension IconIR Overview
• [00:01:00] Demonstration Sample: PMMA Beads in Epoxy
• [00:01:31] Live Look In: Photothermal AFM-IR
• [00:08:03] PMMA in Epoxy Imaging & Spectroscopy Results

• [00:09:25] Q&A

For more information about the products, techniques, and technology featured in this event — or any of our other advanced AFM solutions — please contact us: