ESPRIT Imaging
A Variety of Imaging Options – from Simple Image Acquisition to Fully Featured Image Processing
Image acquisition mode with scan preview window
ESPRIT Scan
Image acquisition software supporting instruments with an external scan system:
- External electron beam control, mode switching, and image acquisition for SEM, STEM and EPMA
- Drivers for IO-Scan and SEMLink
- High quality, high resolution digital images from selectable analog signal sources (SE, BSE, HAADF, etc.)
- Fast preview mode for scan area selection and beam adjustment
- Independent selection of acquisition time, image resolution and scan modes
- Pixel, line and frame averaging including power line synchronization (option)
- Automatic and manual brightness, contrast and gamma correction
- Display of histogram
- µ-marker and image legend display including configuration options
ESPRIT ColorScan
Acquisition of X-ray enhanced color images:
- Instant color images without element preselection or presetting of X-ray ranges
- Intuitive discrimination of phases by different colors and shades in high resolution electron images
- Impressive combination of topological and chemical contrast
- Easy searching for points and regions of interest
- Highlighting of particles, artifacts, or unique regions on sample surface
- Search for homogeneous regions for exact analysis results
- Progressive scan with improving image quality
- Optimally suited for high-speed XFlash® detector systems
Processed and labeled image
ESPRIT Vision
Digital image processing:
- Choice of configurable image filters including binarization and inversion
- Brightness, contrast and gamma correction
- False color display
- B/W and color image processing
- Overlay image for markers, legends and user defined graphics
- Interactive length, area, and angle measurements with data presentation in graphical overlays
- Multi-stage image processing including internal image storage and multiple “undo” functionality
- Image import and export in all common graphic formats
- Twain export and windows clipboard supported
ESPRIT Stereo Vision
3D image visualization and measurement:
- 3D surface topology reconstruction from an stereoscopic image pair
- Free choice of tilt axis including asymmetric tilt facilitates image acquisition with standard SEMs
- Adaptive image comparison modes (anaglyphs, difference image, and full frame correlation)
- Single point depth calculation, line profiles, and multipoint operation
- Powerful 3D result visualization by wire grids, shading, artificial texture, or displacement vectors
- Fully reprocessable project data bases including original data, results, and settings
ESPRIT DriftCorr
- Compensates the image shift of the scanned specimen area by comparing the current image with the image acquired when starting the measurement
- Automatically corrects the external scan generator during acquisition
- Shows the current and the maximum shift value as well as the quality of the comparison process
- Stops the measurement when the maximum correction value is exceeded
- Works in combination with image acquisition functions and the options MultiPoint, Objects, LineScan, Map and HyperMap