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WLI Optical Profilers: Measuring Profile and Real Mean Roughness with 3D Profilers

Discover the practical differences between stylus and areal methods of assessing mean roughness (Sa vs Ra), as well as the key considerations necessary for choosing and using both

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Presented by Samuel Lesko, Ph.D. Dir. of Technology and Apps Development, Bruker Nano Surfaces & Metrology and Ian Armstrong, Ph.D. North America Application Manager, Bruker (April 06, 2020)

       PRESENTATION HIGHLIGHTS:

  • [00:04:44] What is roughness?
  • [00:08:59] Profile roughness filters, data processing, measurement setup
  • [00:18:19] How different is areal roughness? 
  • [00:24:59] How to choose between profile vs areal roughness measurements 
  • [00:28:19] Best practices for roughness measurement 
  • [00:44:11] Demonstration of measurement (user interface) on Bruker ContourGT-X system
  • [00:48:35] Conclusion and audience Q&A

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