SmartProber-P1

High perpendicular-to-plane

magnetic field

Configurable

design and options

Full-wafer coverage

up to 300mm

0.1-100 kΩμm2

RA range

SmartProber-P1

The SmartProber-P1 is aimed at the next-generation over 5.5 kOe.

Various configurations of this type of SmartProber are available. If the high perpendicular field is required, but only small samples need to be measured, the automated wafer stage can be replaced with a cheaper manual stage.

SP-P1 – 6kOe magnet, 300mm rotary wafer-stage
Configuration options:
C: Additional in-plane magnet module with a field strength of 2kOe
Y: 200mm XY wafer-stage
M: Manual wafer-stage for small samples
L: 10kOe magnet

Configurable Design to Match Your Application

Perpendicular Magnets

0.6T Perpendicular magnet
1T Perpendicular magnet

In-Plane Magnet Addition

~0.2T In-plane magnet

Stages

Rotary stage for 300mm wafers
XY stage for 200mm wafers - allows full wafer coverage in-plane measurements
Manual stage for smaller wafers

Talk with us about the right configuration for your application

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