AFM Modes

TappingMode

The most popular AFM imaging mode, the backbone of specialized techniques

The development of TappingMode™ enabled researchers to image samples too fragile to withstand the lateral forces of Contact Mode and use scan speeds much higher than could be obtained in non-contact mode.

TappingMode AFM is a Bruker-patented technique that maps topography by lightly tapping the surface with an oscillating probe tip. The cantilever’s oscillation amplitude changes with sample surface topography, and the topography image is obtained by monitoring these changes and closing the z feedback loop to minimize them.

This popular AFM mode forms the basis for many advanced modes, such as Electric Force Microscopy (EFM) and Magnetic Force Microscopy (MFM). And now, new ScanAsyst® Plus self-optimizing imaging software comes standard with select NanoScope® 6 systems, bringing expanded capability and ease of use to TappingMode measurements.

Request More Information Learn More: The Definitive AFM Modes Handbook

RETURN TO AFM MODES LIST

Topography of antimony dendrites on graphite.

Related Links

Topic Input value is invalid.

Get instant access to the full-length AFM modes handbook.

The Definitive AFM Modes Handbook contains everything you need to understand, select, and apply AFM techniques in materials research, including:

An easy-to-use framework for understanding the seven categories of AFM modes, their capabilities, and their core uses

Detailed descriptions of 50+ modes and variants (including 300+ data images)
Summary information about what each mode is, how it works, and when to use it

Our experts' top probe recommendations for each mode

First Name Please enter your first name

Last Name Please enter your last name

Email Please enter your e-mail address

Phone Please enter a valid phone number

Company/Institution Please enter your Company/Institution

Country or Area Please select your Country

State/Province Please select your State

What best describes your current interest?

Learning: Expanding my knowledge Searching: Investigating technologies for my applications Investing: Buying in one year Purchasing: Actively in the buying process

Do you have any questions about AFM modes, instruments, or applications?

By submitting this form I confirm that I would like to be contacted by Bruker. I have taken note of the Bruker Website Privacy Notice and I agree to the Terms of Use of the Bruker website. Please accept the Terms and Conditions

^{Privacy Notice Terms of Use}

^{* Please fill out the required fields.}