AFM Modes

PhaseImaging Mode

Quickly and easily move beyond topographic imaging

PhaseImaging™ is a secondary imaging mode derived from TappingMode™ that detects variations in composition, adhesion, friction, viscoelasticity, and other properties, including electric and magnetic. Applications include contaminant identification and mapping components of composite materials.

Phase imaging maps the phase lag between the periodic signal driving the cantilever and the oscillations of the cantilever. Changes in phase lag often indicate changes in the properties of the sample surface. Images of topography and material properties can be collected simultaneously.

Phase imaging is a key element in a number of AFM techniques, including Magnetic Force Microscopy (MFM), Electric Force Microscopy (EFM), and Scanning Capacitance Microscopy (SCM).

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PhaseImaging clearly shows microphase separation in SBS tri-block copolymer.

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The Definitive AFM Modes Handbook contains everything you need to understand, select, and apply AFM techniques in materials research, including:

An easy-to-use framework for understanding the seven categories of AFM modes, their capabilities, and their core uses

Detailed descriptions of 50+ modes and variants (including 300+ data images)
Summary information about what each mode is, how it works, and when to use it

Our experts' top probe recommendations for each mode

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