X-ray reflectivity (XRR) provides detailed information on the vertical sample density profile, layer thicknesses, and interface roughness. High-resolution X-ray diffraction (HRXRD) measures the crystallographic structure of the sample. Grazing-incidence Small Angle Scattering (GISAXS) is used for evaluation of nanoparticles and porosity. Residual Stress analysis probes the strain status of bulk samples and polycrystalline coatings.
Along with conventional single-curve scans, LEPTOS enables analysis of high-resolution HRXRD and XRR reciprocal space maps, GISAXS and XRD² Stress frames, area mapping for HRXRD, XRR, and Residual Stress applications. It doesn’t matter whether data have been collected with 0-D, 1-D or 2-D detectors.
The GUI can be customized to accommodate the requirements of both scientific researchers and industrial operators.
LEPTOS R is designed for the analysis of X-ray Reflectivity (XRR) data and off-specular Diffuse Scattering (DS) from thin layered structures. The module is fully integrated in the LEPTOS suite, which incorporates the simultaneous analysis of HRXRD, GISAXS and XRR data. As a part of the LEPTOS suite, the R module inherits all the functionality common for the whole package.
LEPTOS R has been highly rated in several international benchmarks, including the VAMAS project A10. The structure of LEPTOS R is compliant with the newly developed international rfCIF standard for the data format of XRR data.
LEPTOS H stands for High-Resolution X-ray Diffraction and Grazing-Incidence X-ray Diffraction data analysis.
The module is fully integrated in the LEPTOS suite, which incorporates the simultaneous analysis of HRXRD, GISAXS and XRR data. As a part of the LEPTOS suite, the H module inherits all the functionality common for the whole package.
LEPTOS S is an innovative, powerful and comprehensive module for the analysis of Residual Stresses measured by 0D, 1D or 2D detectors by use of classic sin2ψ and extended XRD2 methods. The module is fully integrated in the LEPTOS suite and inherits all the functionality common for the whole package.
LEPTOS G makes an evaluation of Grazing-Incidence Small-Angle Scattering data, measured from the samples containing nanoscale particles embedded within the undersurface region or located on the surface of sample. These can be, for example, buried or surface semiconductor quantum dots and islands, porous materials, condensed powder, embedded in polymers nanoparticles, etc. The license for module G includes also R module for X-ray Reflectivity.
Version | The current software version is V7.10.12 |
Analytical methods |
Dynamical Parratt’s formalism Diversity of interfacial roughness models Operator Method for the calculation of X-ray scattering parameters Patented Method of EigenWaves (MEW) Fast 2x2 and precise 4x4 Recursive Matrix Formalism Classic and extended sin2ψ, as well as XRD2 methods Evaluation of residual stresses from multiple {hkl} Stress/strain gradients in thin polycrystalline coatings |
Operating system |
Windows 8 and 10 (32-bit or 64-bit) |