Exploring the Future of Nanomechanical Testing with Bruker’s Hysitron TI 990 TriboIndenter
With TI 990, you define what is possible
Watch this webinar and hear all about the newest TriboIndenter, directly from Bruker’s experts. With an all-new system architecture and advanced testing modes, TI 990 is set to redefine the landscape of nanomechanical and nanotribological testing.
Watch this webinar find out:
- What is new about the TI 990 system architecture?
- What advancements are integrated into the new nanoDMA IV and XPM II?
- How is the new Performech III controller different?
- What does the redesigned TriboScan 12 software look like?
The webinar also includes a demonstration of the Hysitron TI 990 TriboIndenter.
Webinar Summary
Watch this webinar and explore Bruker’s Hysitron TI 990 TriboIndenter, a revolutionary system that has been redesigned from the ground up to deliver new levels of sample throughput, measurement control, testing flexibility, measurement reliability and performance, and ease-of-use.
Topics covered include:
- TI 990 System Architecture: Learn about industry-leading noise immunity combined with a modular system design that adapts to your needs.
- nanoDMA IV: Discover dynamic nanoindentation with innovative displacement control and amplitude tuning algorithms.
- XPM II: Learn about ultrafast, high-resolution mechanical property mapping with speeds up to 12 measurements per second.
- Performech III: Explore our advanced control and data acquisition system that delivers innovative new feedback control modes.
- TriboScan 12: See how our completely redesigned software package simplifies system setup, operation, and data analysis.
- System Configurability: Understand how the world’s largest and most expandable suite of advanced nanomechanical techniques enables the system to grow with your future research needs.
The webinar also includes a demonstration of TI 990, providing viewers with a practical understanding of its operation and capabilities.
Whatever your nanomechanical testing requirements—whether you need improved accuracy for polymer thin films, increased throughput for combinatorial materials science, or multi-measurement analysis of full 300 mm semiconductor wafers—join us to learn how TI 990 keeps up with your dynamic testing needs.
Find out more about the technology featured in this webinar or our other solutions for Nanomechanical Testing:
Featured Products and Technology
Speaker
Radhika Laxminarayana, NRL Development Engineer, Bruker
David Vodnick
NI Product Line Manager, Bruker
