Nanoscale Infrared Spectroscopy

nanoIR Upgrades

Upgrade your nanoIR platform and expand your measurement capability

Tapping AFM-IR

<10 nm Spatial resolution Chemical Imaging

The new patented Tapping AFM-IR mode is an exciting new capability that provides 10 nm spatial resolution for chemical imaging along with monolayer measurement sensitivity and extends the capability of nanoIR to a broader range of samples. Tapping AFM-IR retains the ease of use of nanoIR technology, so optimum measurement resolution is achieved easily and quickly.

Available on the nanoIR2/2-s and nanoIR1 platforms.

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Chemical characterization of PS-P₂VP block co-polymer sample by Tapping AFM-IR. (a) Tapping AFM height image; (b) Tapping AFM-IR spectra clearly identifying each chemical component; (c) Tapping AFM-IR overlay image highlighting both components (PS@ 1492 and P₂VP@ 1588); (d) Profile cross section highlighting the achievable spatial resolution, 10 nm. Sample courtesy of Dr. Gilles Pecastaings and Antoine Segolene at University of Bordeaux.

FASTspectra OPO Mid-IR Laser

Nylon 12 nanoIR spectrum measured with both the new FASTspectra OPO and FASTspectra QCL lasers. Important C-H stretch, N-H stretch and OH regions are now enabled with rich interpretable data.

The new high pulse rate OPO laser extends the wavelength range of Resonance Enhanced AFM-IR to cover the 2700 to 3600 cm⁻¹ wavenumbers, extending capability to important spectroscopic regions of a wide array of samples.

The new OPO laser also incorporates FASTspectra™, a proprietary technology providing high speed IR spectra measurement in seconds, improving time to data and enabling a more detailed understanding of the sample. The FASTspectra OPO laser compliments the standard FASTspectra QCL laser option that provides coverage from
950-1900 cm⁻¹.

Available on the nanoIR3 and nanoIR3-s, nanoIR2/2-s and nanoIR1 platforms.

Polarization Control

Allows users to study molecular orientation with nanoscale spatial resolution by changing the input polarization of the IR light while studying the associated changes in the nanoscale IR spectra and/or chemical maps at a certain wavenumber.

Available on the nanoIR3 and nanoIR3-s, nanoIR2/2-s and nanoIR1 platforms.

(Left) AFM-IR spectra on electrospun PVDF fibers under two different IR polarizations; (Right) IR absorption image at 1404 cm⁻¹ of crossed PVDF fibers under polarized illumination (polarization direction shown by arrow).

Environmental Enclosure

Provides humidity control in an enclosed environment. The humidity control goes from 15% to 80%, non-condensing. Available on the nanoIR3 and nanoIR3-s.

Environmental Control Accessories

Fluid Imaging Accessory

Accessory for Fluid Imaging. Contact Bruker for upgrades to installed systems. Available on the nanoIR3 and nanoIR3-s, nanoIR2/2-s and nanoIR1 platforms.

Sample Heater/Cooler System

Provides heating and cooling over a practical range of 4°C to 80°C. When used with a separate environmental enclosure, a working range of -20°C to 80°C is available. Available on the nanoIR3 and nanoIR3-s.

Lorentz Contact Resonance Mode

LCR composite image made by overlying the LCR amplitudes collected at three different contact resonances. These resonances were selected to highlight the varying ratios of the lignin and cellulose which compose the sample.

Software Options, Probes and Samples

Allows the user to study molecular orientation with nanoscale spatial resolution by changing the input polarization of the IR light while studying the associated changes in the nanoscale IR spectra and/or chemical maps at a certain wavenumber.

Available on all Anasys nanoIR systems.

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Application Modules

Available as plug in modules for the nanoIR3 and nanoIR3-s systems and provide complementary nanoscale mapping with nanoscale thermal analysis, conductive AFM and Kelvin Probe Force microscopy capabilities.

Laser Switch

Allows users to switch between OPO and QCL laser sources on systems that are equipped with both lasers. Available on the nanoIR3 and nanoIR3-s.

Nano Thermal Analysis

Enables the user to select any point (or series of points) on the AFM image to obtain localized transition temperatures, i.e. Tg and Tm, image the transition temperatures across the sample surface via the mode of Transition Temperature Microscopy (TTM) and collect maps of the sample surface showing variation in relative thermal conductivity or relative temperature across the surface (SThM). Available on all Anasys nanoIR systems and as an addition to select third-party AFMs.

nanoIR Nanoscale Thermal Analysis

Conducting AFM (CAFM)

Allows the user to obtain simultaneous height and current flow maps of the sample surface. Available on the nanoIR3 and nanoIR3-s, nanoIR2/2-s and nanoIR1 platforms.

Conductive AFM (C-AFM)

Kelvin Probe Force Microscopy (KPFM)

Acquire surface potential measurements. Available on the nanoIR3 and nanoIR3-s, nanoIR2/2-s and nanoIR1 platforms.

Kelvin Probe Force Microscopy (KPFM)