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On-Demand Session: High-Performance Photothermal AFM-IR for Novel Nanoscale Chemical Analysis

Learn about the capabilities of the photothermal AFM-IR technique using Bruker’s Dimension IconIR platform.

Presented by Qichi Hu, Ph.D, Senior Application Scientist, Bruker (February 29, 2024)

_{PRESENTATION HIGHLIGHTS:}

[00:02:33] Introduction to Bruker AFM-IR (Technology, Modes, Products)
[00:13:45] High Sensitivity (<1 nm on metal substrate)
[00:29:05] High-Spatial Resolution (<2 nm)
[00:43:10] Controlled probing depth and surface sensitivity
[00:50:23] High Measurement Speed (high IR Imaging rate, fast spectroscopy/hyperspectral)
[00:55:02] Artifact-free (mechanical compensation with PLL)
[00:57:52] Correlative study (Mechanical, thermal, electrical, magnetic)

Q&A

_{PRESENTATION HIGHLIGHTS:}

[00:00:00] What is the baseline noise level, and how to optimize tapping conditions to enhance the sensitivity?
[00:02:20] How long does it take to acquire hyperspectral images?