Introducing PBO-WDS on SEM
WDS for Light Element and Trace Element Analysis
A wavelength-dispersive X-ray spectrometer with a parallel-beam optic (PBO-WDS) such as the QUANTAX WDS has a high sensitivity for the low X-ray energies. This results from the large solid angle of the detector, provided by the X-ray collection optic which can be positioned close to the source of X-ray generation in the sample.
Accordingly, count rates for low X-ray energies registered by the PBO-WDS (per eV) are much higher than those of any conventional WDS or EDS. Therefore, this type of WDS is especially effective for light element analyses and low-kV applications that require a high spatial resolution. Due to the characteristically high signal to noise ratios of WDS, light elements can even be determined in trace element levels.
Further characteristic applications are related to WDS-typical high spectral resolution based on Bragg diffraction.
In this webinar, we will demonstrate the advantages of PBO-WDS with application examples for light element and trace element determination as well as X-ray peak resolution. The webinar will also include a demo of WDS operation using Bruker’s software suite ESPRIT.
Who Should Attend?
- Researchers from industry and academia who are using microanalysis techniques.
- Material scientists and SEM lab managers with an interest in light element determination, trace element determination or X-ray peak resolution.
Speakers
Dr. Michael Abratis
Sr. Application Scientist, Bruker Nano Analytics
Stephan Boehm
Product Manager - micro-XRF on SEM and WDS, Bruker Nano Analytics
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