Nanoelectrical Characterization using Atomic Force Microscopy
AFM provides ultimate utility and versatility for nanoelectrical characterization
Atomic force microscopy (AFM) has unique capabilities that make it ideal for nanoscale electrical characterization of properties including conductivity, resistivity, work function, surface potential, charge/carrier density, and dielectric/piezoelectric properties.
Join us for this webinar to learn about:
- Challenges and advantages of common AFM modes used for nanoelectrical characterization
- Examples showing results on a variety of materials and devices
- Practical aspects of nanoelectrical characterization, including tip/cantilever selection, influence of environment, and quantification possibilities
- How nanoelectrical data can be correlated with AFM-based nanomechanical and nanochemical data
Date: Thursday, September 12 | 8AM PDT | 11AM EDT | 5PM CEST
Find out more about the technology featured in this webinar or our other solutions for nanoelectrical characterization:
Abstract
In this webinar, the presenters highlight how atomic force microscopy (AFM) is ideally suited for nanoscale characterization of electrical properties, including conductivity, resistivity, work function, surface potential, charge. carrier density, dielectric and piezo-electric properties.
The presenters will first give an overview of available AFM modes commonly applied in nanoelectrical material research and describe their advantages and challenges. They will illustrate each mode with a few examples on a variety of materials and devices including semiconductors, 2D materials, batteries, and photovoltaics. They will then address practical aspects, such as selecting the ideal AFM tip and cantilever, influence of the environment, and quantification possibilities.
The presenters will also discuss how the high-resolution imaging capability of these AFM modes can be complemented by local spectroscopy, such as I-V, C-V and domain switching spectroscopy in selected positions, as well as in complete maps through DataCube approaches. Finally, they will describe how these nanoelectrical properties can be correlated with AFM-based nanomechanical and nanochemical characterization data.
Date: Thursday, September 12
Time: 8AM PDT | 11AM EDT | 5PM CEST
Location: Online
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Featured Products and Technology
Speakers
Peter De Wolf, Ph.D.,
Director of Technology & Application Development
Khaled Kaja, Ph.D., Applications Scientist
