2D Material Characterization Using Photothermal AFM-IR and s-SNOM
Explore applications of photothermal AFM-IR and s-SNOM in 2D materials
In this webinar, speakers distinguish between photothermal AFM-IR and s-SNOM, presenting examples for how each can be applied in 2D materials research to gain valuable and unique insights.
Webinar Summary
This webinar addresses the distinction between photothermal AFM-IR and s-SNOM, both of which are nanoscale IR spectroscopic techniques. Along with clarifying the distinction, the presenters demonstrate the broad 2D materials applications for both AFM-IR and s-SNOM.
Physical phenomena such as surface plasmon polaritons and surface phonon polaritons in 2D materials open new opportunities for novel photonic devices through a non-invasive near-field light-matter interaction. s-SNOM provides a unique way to selectively excite and locally detect electronic and vibrational resonances in real space. AFM-IR allows for high-resolution spatial mapping of impurities and microstructural homogeneity via the detection of photothermal expansion with an AFM tip.
AFM-IR and s-SNOM are complementary techniques that can be used in a variety of ways to uniquely characterize 2D materials, providing insight into their structure-property relationships, coupling behavior, and more.
- watch part 1: Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM
- watch part 2: Online Demo of the nanoIR3 System - Photothermal AFM-IR
- watch part 3: Chemical Characterization of Heterogenous Polymeric Materials on the Nanoscale Using Photothermal AFM-IR
- watch part 4: Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices
Find out more information about Bruker's solutions for nanoIR Spectroscopy:
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Speakers
Cassandra Phillips, Ph.D.
Application Scientist, Bruker
Dr. Anirban Roy
Senior Applications Scientist
Dr. Honghua Yang
Staff Engineer
Dr. Qichi Hu, Senior Applications Scientist
