AFM Modes

Force Modulation Microscopy (FMM)

A straightforward path to elasticity and adhesion data

Force Modulation Microscopy™ (FMM) reveals information about a sample’s mechanical properties, such as elasticity or adhesion. This method is useful for materials with nonuniform mechanical properties, like polymer blends and metal alloys.

FMM uses a Contact Mode detection scheme to monitor changes in sample topography, while simultaneously applying a high frequency signal to the cantilever. Changes in sample stiffness, adhesion, or friction affect the cantilever’s oscillation and provide qualitative nanomechanical data.

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Topography (left) and force modulation amplitude (right) image of a cryo-microtomed multilayer polyethylene sample. The force modulation amplitude image reveals layers of alternating material stiffness (40µm scan size).

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The Definitive AFM Modes Handbook contains everything you need to understand, select, and apply AFM techniques in materials research, including:

An easy-to-use framework for understanding the seven categories of AFM modes, their capabilities, and their core uses

Detailed descriptions of 50+ modes and variants (including 300+ data images)
Summary information about what each mode is, how it works, and when to use it

Our experts' top probe recommendations for each mode

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