Industrial Solutions of Measuring Thin Film Fracture Toughness
Learn how fracture toughness of thin films can be measured using nanoindentation and nanoscratch testing
Product innovation in modern industries—especially the semiconductor, hard coating, and display industries—relies heavily on decreasing the thickness of thin-film components.
We are pleased to present this webinar as one part of our 4-part Thin Film Measurements Series, in which our experts provide the information manufacturers need about leading-edge nanomechanical testing technology for thin films measurement, complete with use case studies for a range of industrial applications.
Investigate High Precision, High-Resolution Thin Film Failure Analysis
Fracture toughness is an indicator of a material’s ability to resist crack propagation, regardless of crack’s size or shape and the stress applied to the crack itself. Precise fracture toughness measurement is increasingly important in industrial applications because of the trend towards thinner, stronger films; high-strength thin-film materials become more fragile with increasing strength
With the continual decrease of material thickness and increase of structural complexities, accurately measuring thin film fracture toughness has become a major focus of—and challenge to—manufacturers' failure analysis processes.
This webinar addresses and proposes practical solutions for the challenges manufacturers face—including film thickness, interface limitations, and crack length—when measuring thin film cohesion in various applications.
Find out more about the technology featured in this webinar or our other solutions for Measuring Thin Film Fracture Toughness:
Featured Products and Technology
Speaker
Pal-Jen Wei, Ph.D.
Applications Scientist, Bruker
Dr. PJ Wei is an Application Scientist at Bruker Nano Surfaces, responsible for application development and technical support of Nano-Mechanical, Nano-Tribological and Nano-Indentation instruments. His academic background was in mechanical engineering and nano-metrology. Dr. Wei obtained his Ph.D. at National Cheng Kung University, Taiwan; majoring in nano-mechanical properties of thin solid films. Prior to joining Bruker, Dr. Wei was an Assistant Prof. at the Nanotechnology and Micro-system Institute in Taiwan and then a senior engineer of RD department in Catcher Tech. He has published in over 30 peer reviewed international journal papers and has also presented at many international conferences.
