Introducing the New Dimension IconIR Nanoscale Infrared Spectroscopy and Chemical Imaging System

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:00] Introduction to photothermal AFM-IR and Bruker's nanoIR technology
• [00:05:00] Features and Capabilities of the Dimension IconIR
• [00:13:18] Live Demonstration Part 1
• [00:28:30] A User's Experience - Capabilities of the Dimension IconIR
• [00:39:20] Live Demonstration - Part 2

       _{LIVE Q&A WITH THE PRESENTERS:}

• [00:48:42] How does Surface Sensitive Mode compare to Resonance Enhanced AFM-IR?
• [00:50:01] What is the wave number range for photothermal AFM-IR measurements?
• [00:50:40] For the IconIR, where is the IR laser located and what is the highest resolution?
• [00:52:10] What are the maximum scan area, AFM scan area specifications of the platform?
• [00:52:42] How do you calibrate the spring constant stiffness of the cantilever?
• [00:54:05] How do you avoid cross-talk from the cantilever resonance frequency?
• [00:56:02] What sample thickness can be measured with the Dimension iconIR?
• [00:57:13] Is it possible to use the photothermal AFM-IR technique on a MultiMode AFM?
• [00:58:08] With regard to inorganic materials, does IconIR support s-SNOM operation mode?