Flexible and portable XRF mapping solutions for Art and Conservation: Bruker’s ELIO and CRONO spectrometers
The Art and Conservation Webinar Series - Part II
XRF analysis is a key component for scientists in art studies, providing elemental data that underpins activities ranging from conservation and preservation of objects, to reconstructing the history of an object. We provide best in class solutions for handheld and highly sophisticated mapping instruments for the field. With the integration of flexible and portable XRF (pXRF) instruments ELIO and CRONO to the Bruker product portfolio we now cover the full range of possible needs for XRF analysis in Art & Conservation.
The Bruker ELIO is a tripod-mounted, compact energy dispersive XRF system with a 1 mm spot size. It offers the unique capability to perform compositional mapping of areas up to 10 cm x 10 cm in a completely non-contact fashion. Designed for absolute portability and flexible positioning, this instrument allows in-situ scanning of any cultural heritage object.
The Bruker CRONO boosts mapping capabilities while maintaining mobility and flexibility in nearly any measurement location with fast acquisition on large surfaces. The lightweight head and frame for the CRONO can quickly be packed for transportation for on-site macro-XRF (MA-XRF) measurements in galleries or on temporary scaffolding in historic buildings. With spot sizes of 0.5 mm to 2 mm, the CRONO provides a mobile mapping solution for objects and large paintings.
In this webinar we will present the capabilities and demonstrate the operation of ELIO and CRONO. We will show examples of how both instruments are currently integrated in Art & Conservation studies.
Who Should Attend?
- Researchers, professionals and students in cultural heritage conducting XRF analysis
- Archeologists or Art Scientists working in-situ in Cultural Heritage sites
- Those interested in broadening their understanding of micro-XRF analysis of artifacts in general
Speakers
Michele Gironda
Head of Global Segment Management, Bruker Nano Analytics
Dr. Henning Schröder
Product Manager micro-XRF, Bruker Nano Analytics
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