Bruker
Products & Solutions Applications Services & Support News & Events About Careers
Please use at least 2 characters (you are currently using 1 character)

Languages

▶ Watch On-Demand | 53 Minutes

Using Nanoelectrical Solutions to Expand the Capability of AFM

Innovative nanoelectrical AFM modes provide a significant new capability for materials characterisation
Presented by Peter De Wolf, Ph.D., Worldwide Application Director, Bruker Nano Surfaces & Metrology (March 29, 2018)

Featured Products and Technology