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▶ Watch On-Demand | 53 Minutes
Using Nanoelectrical Solutions to Expand the Capability of AFM
Innovative nanoelectrical AFM modes provide a significant new capability for materials characterisation
Presented by Peter De Wolf, Ph.D., Worldwide Application Director, Bruker Nano Surfaces & Metrology (March 29, 2018)
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Dimension Icon
Proven highest performance and versatility in an easily tunable AFM platform — now available as IconIR-ready
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Turnkey AFM systems that deliver unique, first-and-only modes and capabilities for advanced materials research
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AFM Modes
AFM modes and the broad capabilities from AFM beyond imaging
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