Nanoscale IR Spectroscopy (AFM-IR): Achieving Molecular Understanding of Polymer Systems

This webinar discusses achieving molecular understanding of polymer systems using AFM-IR spectroscopy. AFM-IR is a technique that uses an atomic force microscope tip to detect the infrared absorption of a sample at the nanoscale.

The speaker, Greg Meyer from Dow Chemical, begins by discussing the limitations of conventional infrared spectroscopy due to diffraction. AFM-IR overcomes this by using an AFM tip to detect the local infrared absorption.

Dr. Meyer then presents several examples of using AFM-IR to characterize polymer materials, including:

• An epoxy-polyether blend where AFM-IR revealed the phase separated morphology and epoxy-rich domains
• A polyurethane chemical mechanical polishing pad where AFM-IR was used to map the urethane-rich domains
• A multilayer agricultural film with AFM-IR characterization of the different polymer layers
• A reverse osmosis membrane where AFM-IR could discern and probe the thin polyamide discriminating layer

In summary, AFM-IR provides chemical information about polymer systems at the nanoscale, revealing morphology, composition, and interfacial chemistry that cannot be accessed with conventional infrared spectroscopy. The technique works well for a wide range of polymer materials and applications.