On-Demand Session: Advanced Nanoscale Chemical Analysis using Photothermal AFM-IR & Correlated Mapping of Mechanical and Electrical Properties

_{PRESENTATION HIGHLIGHTS:}

[00:00:00] Introduction to AFM

AFM Modes for Property Mapping

• [00:03:10] PeakForce QNM
• [00:06:13] AFM-nDMA
• [00:09:25] PeakForce KPFM
• [00:11:46] AFM-IR

[00:16:20] Hardware Configuration with Bruker's IconIR Scanning Probe Microscopy System

[00:18:30] Correlation of measurements (MIRO)

_{PRESENTATION HIGHLIGHTS:}

[00:00:00]Poly-Styrene & Low Density PolyEthylene Applications

• [00:00:32] Point Spectroscopy to Reveal the Chemistry
• [00:02:14] AFM-IR Maps to Show the Different Chemical Domains 
• [00:02:55] Correlative nano-Mechanical, Electrical and Chemical Mapping

[00:05:25] Poly-Styrene-Butadiene Rubber Applications

• [00:06:00] Mechanical Properties
• [00:07:00] Chemical IR Map
• [00:10:12] Photothermal AFM-IR

[00:11:30] Polymer blend of Poly-Carbonate-Poly Applications

• [00:11:55] nDMA for Viscoelastic Properties
• [00:17:30] AFM-IR DataCube for Hyperspectral Imaging
• [00:07:00] Lithium Battery Cathode Example

[00:21:35] Summary

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:00] Is AFM-IR Destructive for the top layer of the sample? What is the effect of topography on IR absorption?
• [00:02:10] What is the Z depth resolution of AFM-IR? Is there any way to modify or minimize it?
• [00:03:30] Does it take 12 hours to record all AFM-IR Images?
• [00:04:25] Which technique (mode or contact mode) provides a better lateral resolution tapping?
• [00:04:50] What is the smallest size of structure that can be imaged chemically?
• [00:06:21] In AFM-IR, is it possible to use tapping mode and infrared mapping simultaneously?
• [00:06:54] Which platforms offered by Bruker offer AFM-IR?