Virtual Event, Actual Science

Advanced 3D Optical Roughness Metrology

Learn from experts about the applications and advantages of Bruker's NPFLEX

Explore Solutions for Non-Contact, 3D Surface Characterization

This workshop on Advanced 3D Optical Roughness Metrology features Bruker’s NPFLEX 3D Optical Profilometer. The on-demand recording includes presentations and technical demonstrations on:

3D measurement of roughness and shape, from the sub-nanometer to micron scale

How to measure large industrial parts and samples with complex geometries

How to measure inside a cylinder

Performing roughness measurements with white light interferometry (WLI)

Watch Full Event On-Demand

Featured Presentations & Technical Demonstrations

Understand the applications and advantages of the NPFLEX.

View the Program Flyer

With introduction and closing remarks by Carmen Pettersson, Marcom Manager EMEA, Bruker BioAFM

_{ON-DEMAND SESSIONS | 45 MINUTES}

An Introduction to the NPFLEX 3D Optical Profilometer and Applications Using the NPFLEX

Emmanuel Paris
Sales Manager EMEA, Bruker BioAFM

_{ON-DEMAND SESSIONS | 40 MINUTES}

Two-Part Demonstration of the NPFLEX WLI-Based 3D Optical Profiler

Dr. Udo Volz
Applications Engineer, Bruker BioAFM

Featured Products & Technology

NPFLEX

The NPFLEX enables non-contact, 3D surface characterization of large industrial parts, orthopaedic medical implants, and samples with complex geometries. Applications for the NPFLEX system include quantification of wear and corrosion as well as measurements on equipment including: Aerospace, automotive, and precision machining components; Additive manufacturing; Gears, dynamic bearings, and seals; Turbine blade camshafts; and Hip, spine, and femoral implants

3D Optical Profilers

Non-contact 3D surface measurement, inspection, and analysis

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Access Session On Demand

In this workshop, Bruker BioAFM experts discuss and demonstrate leading-edge techniques and the latest applications using the NPFLEX WLI-based 2D Optical Profiler. Submit the form for instant, full-length access to this event, Q&A with our experts, and related resources.

Explore Advances in White Light Interferometry-Based Profilometry

Understand the working principle of white light interferometry and techniques used for WLI imaging.
Gain new insight into the applications and advantages of Bruker's NPFLEX system across a wide range of industries.
Hear our experts answer audience questions about NPFLEX system instrumentation, configuration, and capabilities.

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Watch On Demand

Explore Advances in Stylus Profilometry

In this workshop, Accurate Metrology for Micro- and Nano-Fabrication with Stylus Profilometry, our speakers discuss key aspects of stylus profilometry, including the details researchers need to know to obtain reliable and repeatable results.

Particular attention is paid to the following topics:

What does a stylus profilometer measure?
How does a stylus profilometer work?
What tests, applications, and sample materials are stylus profilometers ideally suited for?
How do you select the right stylus probe for your application?

If you have any questions about our products or services, please contact us. Follow @BrukerNano on Twitter for event, product, and webinar updates.

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