Dimension Nexus AFM
Dimension Nexus™ delivers an ideal combination of data quality, experiment flexibility, and ease of use in a small-footprint system. It incorporates the milestone innovations of Bruker's NanoScope® 6 controller and PeakForce Tapping® technology to deliver more functionality than competing systems in its class. Suitable for both routine and custom experiments and easily upgradable in the field, Dimension Nexus is both an excellent starter system and a perfect addition to any thriving AFM lab.
Provides Core Performance and Value in Every Scan
Nexus consistently generates highly accurate, repeatable, publication-ready results for a wide range of sample types in both research and industry applications.
Ensuring High Performance
Central to this system's best-in-class capabilities is its unique combination of cutting-edge hardware, software, and accessories, including:
- Full suite of PeakForce Tapping modes for highest resolution imaging and quantitative mechanical, electrical and chemical property mapping on the widest range of samples
- Latest generation NanoScope 6 controller with lowest noise, highest speeds, and utmost versatility for unrivalled capabilities and ease-of-use
- XYZ closed-loop scanner, drift-compensated bridge structure, and integrated granite base for small-sample performance on an open-access, large-sample AFM
- Largest selection of dedicated AFM Probes optimized for specific modes and samples
Guaranteeing Stability
When imaging over long periods of time, Dimension Nexus exhibits minimal drift and, over long scan lengths, the system shows no scanner artifacts or tip degradation.
[Top] Start and end of an array of 360 trenches with an overall scan size of 90x2 µm (16384x16 px) in PeakForce Tapping with an SAA-HPI probe. Critical dimension analysis showed no scanner artifacts or tip degradation over the full range.
[Bottom] Trench-to-trench pitch measurements across all 360 trenches, showing near-zero deviation over the entire scan range.
Delivers Outstanding Value and Ease of Use
Nexus provides distinct advantages for researchers with early-stage labs or future plans to expand their AFM research:
- The base configuration with programmable stage for high-throughput, multi-site measurements rapidly delivers high-quality data to address standard applications.
- Operators of all experience levels can produce reliable results with ease-of-use features, such as streamlined sample/probe setup, ScanAsyst self-optimizing imaging, and advanced data analysis software.
- Extensive upgrade options — unique operating modes, reliable environmental control, and powerful software integrations — ensure the system can grow with your research.
Offers Future Versatility and Customization
In addition to being upgradable, Dimension Nexus is open-access to facilitate experiment customization. There is physically open access to the probe-sample junction, accommodating electrical connection attachments and other custom accessories. The NanoScope 6 controller also provides an open hardware and software platform with front-panel BNC connectors, scripting software options, and easy data import to Python for custom analyses.
Enables Full Range of Applications
With a 150 mm open-access programmable stage, compatibility with majority of Bruker's 50+ modes including full PeakForce Tapping capabilities, fluid imaging, environmental control, and more, Nexus delivers affordable AFM excellence for a wide range of applications and experiments, including:
- Mapping nanomechanical properties of polymers and composite materials
- Characterizing graphene, moiré superlattices, and other 2D materials at the nanoscale
- Correlating structural and ferroelectric properties of perovskites in photovoltaics
- Conducting in-situ and operando studies of the local electrochemical activity of lithium-ion batteries
- Quantifying nanoscale surface roughness of semiconductor thin films and substrates
- Manipulating and characterizing the electrical properties of DNA nanowires for nanoelectronic devices
Contact us to discuss your measurement requirements and options for system specialization, or submit a sample run request to learn how a Bruker AFM is best suited for your applications.
Dimension Nexus Select Specifications
X-Y Scan Range |
90 μm x 90 μm typical, 85 μm minimum |
Z Range |
10 μm typical in imaging and force curve modes, 9.5 μm minimum |
Sample Size/Holder |
150 mm vacuum chuck for samples, ≤150 mm diameter, ≤15 mm thick |
Motorized Positioning (XY Stage) |
150 mm x 150 mm inspectable area; 6 μm repeatability, bidirectional; programmable for multi-site measurements |
Microscope Optics |
5 MP digital camera; 180 μm to 1465 μm viewing area; digital zoom and motorized focus |
Certification |
CE |
| Download the brochure for full specs list |
Product Comparison: Dimension Nexus and Dimension Icon
Bruker offers an expansive selection of high-quality AFM systems. Our Dimension AFMs feature industry-leading nanoscale imaging and characterization technologies built on decades of AFM experience and with constant collaboration with customers. Dimension Icon, our flagship product, sets the highest possible standard for the entire market of commercial AFMs. Dimension Nexus now joins the line to provide excellent value and performance in a cost-effective AFM.
Scroll down to see an overview of the differences in key features and capabilities between these two best-in-class systems.
Key features and specs
| Dimension Nexus |
Dimension Icon | |
|---|---|---|
| Max. Sample Size (XY) | 150 mm | 300 mm |
| Motorized Stage Range | 150 mm x 150 mm | 150 mm x 180 mm |
| Small & Multi-Sample Compatibility | Yes | Yes |
| Sample Flexibility | Tip Scanner | Tip Scanner |
| XY-Scan Range | 90 µm x 90 µm | 90 µm x 90 µm |
| Z-Range | 10 µm | 10 µm |
| System Footprint (W x L) | 24" x 32" (plus customer desk/workstation) | 47" x 94" (including integrated workstation) |
| Controller | NanoScope 6 | NanoScope 6 |
| Programmable Measurements | Yes | Yes |
| Automated Metrology Recipes | No | Yes |
| Open-Access Platform | High degree of flexibility for customization | Maximum flexibility for customization |
Measurement capabilities
| Dimension Nexus |
Dimension Icon | |
|---|---|---|
| High-Resolution Imaging | Atomic lattice resolution | Atomic defect resolution |
| High-Speed Imaging | Fast Tapping | FastScan dedicated high-speed AFM; Fast Tapping |
| PeakForce Tapping | Yes | Yes |
| ScanAsyst (Self-Optimizing Imaging) | Yes | Yes |
| PeakForce Tapping Derivative Modes* | Yes | Yes |
| Chemical Identification Capability | No | IconIR upgradable |
| Hyperspectral Imaging | DataCube | DataCube |
| Other Modes & Options* | Wide range to address majority of applications | Complete range for industry-leading application coverage |
| * Contact us or download the brochure to see the full modes list |
Powered by the NanoScope 6 AFM Controller
Featuring higher speeds, lower noise, and greater AFM mode flexibility, the NanoScope 6 controller allows users to harness the full potential of our high-performance Dimension and MultiMode AFM systems. This latest generation controller provides unprecedented accuracy, precision, and versatility for nanoscale surface measurements in every application.
NanoScope 6 uniquely enables Bruker AFMs to:
- Operate in more imaging modes than is possible with competing systems, including unique and advanced AFM modes that require complex control and analysis;
- Collect accurate, quantitative data for nanoelectrical and nanomechanical property measurements in every application; and
- Optimize and customize scanning parameters to meet even the most demanding research and industry measurement requirements.