Recent Advancements in Infrared Nano-imaging with Nano-FTIR Spectroscopy
Origins of Emergent Function and How Function is More than a Sum of the Parts
Learn more about the use of s-SNOM to unravel chemical heterogeneity effecting functional properties in materials due to complex inter- and intra-molecular coupling of heterogeneous phases.
Webinar Summary
This webinar introduces scattering scanning nearfield optical microscopy (s-SNOM), which provides information about the complex optical properties of the nanoscale region of a sample under a metallized tip that nanofocuses optical radiation. Recent developments in novel methods, advanced light sources, and refined instrumentation have made s-SNOM more valuable and accessible.
Capabilities for s-SNOM are available on Bruker’s nanoIR3-s and nanoIR3-s Broadband platforms, and the technique itself was developed in collaboration with the webinar’s guest speaker, Professor Markus Raschke, Dept. of Physics/JILA, University of Colorado.
After a thorough and illustrative introduction to the method, Prof. Raschke presents his research efforts towards using s-SNOM, this new dimension in optical nanoprobe imaging, to access the functional properties of materials and systems including electronic materials, energy materials, nano-biomaterials, quantum systems, and more.
Following Prof. Raschke’s comprehensive presentation, he answers questions from the audience covering topics from the maximum sensitivity level of s-SNOM to the use of complementary AFM techniques with s-SNOM.
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Speakers
Dr. Markus Raschke
Department of Physics and Department of Chemistry, JILA, University of Colorado
Dr. Honghua Yang
Staff Engineer
Dr. Qichi Hu, Senior Applications Scientist
Dean Dawson, Senior Director, Business Manager - nanoIR, Bruker Nano