Electric Force Microscopy (EFM)
As consumer electronics become sleeker and smaller, they also increase in computing power and data storage capacity. Electronics development scientists often need to map the electronic characteristics of complex, sub-micron electrical materials and assemblies.
Electric Force Microscopy (EFM) measures electric field gradient distribution above the sample surface. EFM, like Magnetic Force Microscopy (MFM) relies on LiftMode™, a two-pass technique that interleaves TappingMode™ scan lines at the sample surface with scan lines at a designated height above the surface.
EFM is used for electrical failure analysis, detecting trapped charges, mapping electric polarization, and performing electrical read/write, among other applications. It is part of Bruker’s extensive suite of nanoelectrical characterization modes.
