AFM Modes

Magnetic Force Microscopy (MFM)

Simultaneously image magnetic and topographic properties

The study of magnetic forces at the nanometer scale has long been of interest to investigators of magnetic recording materials, superconductors, and magnetic nanoparticles, among others. Magnetic Force Microscopy (MFM) is a secondary imaging mode derived from TappingMode™ that maps the magnetic force gradient above the sample surface while simultaneously obtaining topographical data.

MFM relies on a patented two-pass technique, LiftMode™. The system alternates scan lines at the sample surface and at a designated lift height above the sample surface, to separately measure topography and magnetic force, respectively.

MFM can be used to image both naturally occurring and deliberately written domain structures in magnetic materials.

PeakForce MFM is a new advance in the field of high-resolution magnetic imaging, offering superior spatial resolution, enhanced sensitivity, added data channels, and the ability to image delicate samples with greater precision.

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Magnetic domains in a steel sample.

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The Definitive AFM Modes Handbook contains everything you need to understand, select, and apply AFM techniques in materials research, including:

An easy-to-use framework for understanding the seven categories of AFM modes, their capabilities, and their core uses

Detailed descriptions of 50+ modes and variants (including 300+ data images)
Summary information about what each mode is, how it works, and when to use it

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