S4 T-STAR

The S4 T-STAR^® is a versatile tool for the analysis of a broad range of sample types including suspensions, powders, nanoparticles or films. This puts it ahead of ICP, which requires fully dissolved liquid samples.

• The  TXRF spectrometer S4 T-STAR® offers lowest detection limits in the sub-ppb range.
  
•  TXRF offers lowest operation costs and does not require, gases, media or sophisticated lab infrastructures.
• The automatic quality control feature provides confidence in data and instrument quality.
• The system is optimized for 24/7 operation in industrial routine analysis.
• Bruker's wide selection of sample trays and tools accelerates sample preparation and minimizes errors and contamination risks.

The GIXRF Option for the S4 T-STAR allows users to undertake advanced materials characterization via GIXRF (Grazing Incidence X-Ray Fluoresence). GIXRF is particulary suited for the analysis of nanoparticles, monolayers and systems with stratified layers. Find out more by downloading the flyer. 

When detecting samples at ultra-low ppb limits contamination avoidance is of the highest priority – when working with a pure sample the key to this is excellent sample preparation.

Bruker provides a range of accessories alongside their S2 PICOFOX and S4 T-STAR systems.

These include a T-BOX to help achieve contamination-free and accurate sample pipetting and the T-DRY for the vacuum desiccation of samples; with both being designed to help users avoid making any contact with the sample carrier.

Following the collection of measurements, the sample disks can be efficiently and effectively cleaned for later use using Bruker’s chemically resistant washing cassette before clean storage in the T-BOX.

Find out more by dowloading our TXRF Accessories Brochure and watching our video on sample preparation during TXRF.