On-Demand Session: Resonance Enhanced Force Volume AFM-IR: A Powerful New Technique for Nanoscale IR Characterization

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:00] Introduction to nanoscale IR and AFM-IR
• [00:04:04] Bruker's unique AFM-IR Modes 
• [00:05:45] Introduction to the REFV AFM-IR Principle
• [00:08:22] REV AFM-IR Examples
• [00:13:32] Characteristics specific to RV-AFM-IR
• [00:19:31] Conclusion

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:00] Experiment layout
• [00:03:05] Selecting points in Spectral View for IR spectroscopy measurements
• [00:04:15] Showing frequency sweep
• [00:07:47] Real-time fitting of the resonance
• [00:09:15] Offline analysis of results

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:00] Case study introduction
• [00:02:42] Sample information
• [00:04:40] REFV AFM-IR mode with PLL on
• [00:07:15] REFV AFM-IR mode with frequency-sweep
• [00:09:17] Importing REFV AFM-IR data to Python for custom analysis
• [00:11:20] Acknowledgements

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:00] Does IR measurement depend on the type of samples such as soft polymers or heart polymers?
• [00:01:25] What is the rough measurement time for REV AFM-IR?
• [00:02:38] What types of probes are used for these measurements?
• [00:04:23] Can we look at the same orders and properties in AFM-IR while simultaneously looking at the monolayer density through other channels such as phase contrast or mechanics?
• [00:06:38] Does the IR amplitude change depending on the contact resonance frequency?
• [00:08:45] What is the difference between the adhesion mapping and what we get through REV AFM-IR and peakforce Tapping?