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Rendering of e-book cover with illustration of tool used in AFM-based nanoelectrical property measurement
Rendering of e-book cover with illustration of tool used in AFM-based nanoelectrical property measurement
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E-Book: The Latest Advancements in AFM Nanoelectrical Modes

Learn about the fundamental elements and advantages of AFM-based electrical characterization and how Bruker's DataCube modes expand the number and type of potential applications of nanoelectrical property measurement.
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Submit the form to gain instant full-length access to chapters on:

  • The history, advantages, and constraints of atomic force microscopy (AFM), especially for electrical characterization.
  • The far-reaching academic, scientific, and industry impacts of AFM-based nanoscale electrical property characterization.
  • How 3D nanoelectrical property mapping — made possible with DataCube modes — removes the operational, technical, and analytical limitations that have historically restricted innovation.
  • Case studies of practical applications of AFM nanoelectrical modes.

 

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