AFM Modes

Nanoindenting and Nanoscratching

Hardness and wear testing of nanometer-scale samples

Indentation is a common tool for determining the mechanical properties, such as the hardness or modulus, of a sample. With the help of diamond probes on AFM systems, researchers are able to nanoindent very small volume samples to obtain this valuable data. AFM can also perform nano-scratching and wear testing to investigate film adhesion and durability.

Bruker’s NanoMan and NanoPlot software packages provide the user with flexible, yet extremely accurate, control of the in-plane position and movement of the SPM probe for direct, precise manipulation of nanoscale objects, surface indentations, as well as high-definition Nanolithography.

Request More Information Learn More: The Definitive AFM Modes Handbook

RETURN TO AFM MODES LIST

Three different tribofilms subjected to wear with a visible wear scar in the center of each. The AFM images are from a 2um scan area near the center of each scar.

Related Links

Topic Input value is invalid.

Get instant access to the full-length AFM modes handbook.

The Definitive AFM Modes Handbook contains everything you need to understand, select, and apply AFM techniques in materials research, including:

An easy-to-use framework for understanding the seven categories of AFM modes, their capabilities, and their core uses

Detailed descriptions of 50+ modes and variants (including 300+ data images)
Summary information about what each mode is, how it works, and when to use it

Our experts' top probe recommendations for each mode

First Name Please enter your first name

Last Name Please enter your last name

Email Please enter your e-mail address

Phone Please enter a valid phone number

Company/Institution Please enter your Company/Institution

Country or Area Please select your Country

State/Province Please select your State

What best describes your current interest?

Learning: Expanding my knowledge Searching: Investigating technologies for my applications Investing: Buying in one year Purchasing: Actively in the buying process

Do you have any questions about AFM modes, instruments, or applications?

By submitting this form I confirm that I would like to be contacted by Bruker. I have taken note of the Bruker Website Privacy Notice and I agree to the Terms of Use of the Bruker website. Please accept the Terms and Conditions

^{Privacy Notice Terms of Use}

^{* Please fill out the required fields.}