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Defects & Contamination

CdTe Monitoring

CdTe Monitoring

X-ray diffraction imaging (XRDI, also known as X-ray topography) is used to image crystalline defects in otherwise perfect (or near perfect) substrates. Using the virtual slits on the QC-RT it is possible to image the sample in modes to visualise scratches, dislocations and other defects, but also to image orientation contrast within the substrate. 

Image the Sample In Modes

Using the virtual slits on the QC-RT it is possible to image the sample in modes to visualise scratches, dislocations and other defects, but also to image orientation contrast within the substrate.

Images Created From The Same Data

These images are created from the same data and allow different long and short range characteristics to be imaged with different processing.

Related Products

X-Ray Defect Inspection

QC-RT

The Bruker QC-RT is a defect metrology system using the latest X-ray diffraction imaging (XRDI) technology in reflection mode to identify defects in high value substrates, such as CdTe and other dense materials.
QC-RT