▶ Watch On-Demand | 1 Hr 2 Minutes

On-Demand Session: Thin Film Characterizations Applied in Semiconductor Industries

Nanoindentation and nanoscratch testing methods applied to mechanical property analysis of thin films

Thin Film Characterization Applied in Semiconductor Industries

Necesitas aceptar cookies para reproducir este vídeo.

Presented by PJ Wei, Ph.D., Application Scientist, Bruker

Featured Products and Technology

Hysitron TI 990 Web Teaser-BRUKER

Hysitron TI 990 TriboIndenter

The world's most comprehensive and highest performance nanomechanical test system

DOWNLOAD BROCHURE

Nanomechanical Test Systems

Nanomechanical Test Systems

Stand-alone solutions for highly accurate and reliable quantitative mechanical and tribological characterization at the nano- and microscales

REQUEST MORE INFORMATION

Nanomechanical Instruments for SEM/TEM

Nanomechanical Instruments for SEM/TEM

Hysitron PicoIndenters for in-situ mechanical experiments in scanning electron and transmission electron microscopes

REQUEST MORE INFORMATION

nanoDMA III - Dynamic Nanoindentation

nanoDMA III

Nanoscale dynamic mechanical analysis

RETURN TO SESSION OVERVIEW