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7300LSI Datasheet

Learn more about the 7300LSI, a versatile X-ray diffractometer for epitaxial and crystalline thin film monitoring

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7300LSI

Automated x-ray diffractometer for R&D and fab production monitoring on full wafers

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You can also email us for more information at productinfo@bruker.com.

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7300LSI

Automated x-ray diffractometer for R&D and fab production monitoring on full wafers

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