The HYPERION II stands as a pioneering powerhouse in the realm of infrared microscopy. Its exceptional capabilities enable IR imaging at the diffraction limit, elevating the standard for ATR microscopy. Notably, it represents a groundbreaking amalgamation of FT-IR and Infrared Laser Imaging (ILIM) microscopy, the first of its kind, rendering a singular and comprehensive device that encompasses all three measurement modes: transmission, reflection, and ATR.
Above all, it is about having complete access to an instrument. Access to the experiment, the samples, and the parameters. This is the foundation of the HYPERION II and its most valuable asset: providing full control.
Whether FT-IR measurements in single point mode, mapping or imaging with different detectors or objectives, special sample stages or with ATR or Grazing Angle objective. At any point you can influence the outcome of your results - and make them better.
This is the clear difference to our LUMOS II IR microscope. Where the LUMOS II relieves the user of tedious experimental details and automates the measurement process, the HYPERION II remains a precise tool that only does what the user demands.