Semiconductor & Nanotech

RF Devices

RF devices are at the heart of the latest 5G communications devices. Bruker provides X-ray metrology through XRD to characterize the epi films, and also the material phase and compositions used in piezo-electric materials required in BAW / SAW filters.

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BAW/SAW Filter Phase & Composition

Phase of polycrystalline films is critical to performance. XRD is the established technique to be able to measure this on PZT and other polycrystalline films.

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pHEMT Characterisation

The Bruker QCVelox-E is the state of the art leader in epi monitoring and is widely used in the compound semi industry.

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