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Featured Presentations
On-Demand Session | 20 Minutes
Mapping Nanomechanical Properties: How to Best Benefit from the Latest Innovations in PeakForce QNM
Bede Pittenger, Ph.D.
Senior Staff Development Scientist, Bruker
Learn about the latest improvements to PeakForce QNM and how they improve the breadth of nanomechanical information available and the accuracy of the resulting property maps, as well as when and why it is of interest to examine the associated PeakForce Capture DataCubes.
On-Demand Session | 25 Minutes
Multidimensional Imaging of Physical Properties of Materials Using Novel Ringing Mode
Igor Sokolov, Ph.D.
Tufts University
In this talk, our guest presenter describes the unique imaging capabilities of novel Ringing mode — including its various imaging channels — and provides several examples of Ringing mode applications, feat. imaging of polymers, fixed biological cells, and molecular coatings on nanoparticles.
On-Demand Session | 25 Minutes
Using Machine Learning to Classify and Correlate AFM Phase Images
Dalia Yablon, Ph.D.,
Founder, SurfaceChar LLC
Hear about the latest research on building and using machine learning models to characterize the microstructure and bulk mechanical properties of impact copolymer samples.
On-Demand Session | 25 Minutes
Accessing the Viscoelasticity of Polymers at Multiple Scales: Bulk vs. AFM-nDMA
Marius Chyasnavichyus, Ph.D.
Associate Research Scientist, Dow Inc
Gain a deeper understanding of the advantages of using AFM-nDMA for nanoscale viscoelastic property characterization and how it transcends the limitations of traditional bulk DMA.
On-Demand Session | 20 Minutes
Review of Recent Advances in Electrical Characterization using Atomic Force Microscopy
Peter De Wolf, Ph.D.,
Application Director, Bruker
Explore the latest advances in AFM mode technology that are expanding the possibilities of imaging/spectroscopy, as well as their most innovative and impactful implementations.
On-Demand Session | 25 Minutes
Advances in Understanding Electrochemical Degradation: The Power of Co-Localized KPFM
Paul H. Davis, Ph.D., Surface Science Lab Manager
Corey M. Efaw, Materials Sci.& Engineering Ph.D. student
Olivia O. Maryon, Materials Sci.& Engineering Ph.D. student
Boise State University
Learn about the advantages of using KPFM co-located with other characterization methods, with examples of recent co-localized KPFM applications and the valuable insights gained from them.
On-Demand Session | 25 Minutes
Understanding the Mechanism of (Photo)Electrochemical Transformations in Functional Architectures for Artificial Photosynthesis
Francesca Maria Toma, Ph.D.
CSD Staff Scientist, Lawrence Berkeley National Laboratory
In this presentation, our guest presenter speaks about her latest research on combining photoelectrochemical measurements with AFM-based techniques to better understand different material systems under operating conditions.
On-Demand Session | 25 Minutes
Quantifying Nanoscale Electromechanical Properties using Piezoresponse Force Microscopy
Liam Collins, Ph.D.,
Research & Development, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
Discover the best practices for accurate material property quantification with PFM exemplified, including identifying/avoiding background signals and electrostatic crosstalk.
Featured Product Demonstrations
On-Demand Session | 20 Minutes
Live Demonstration feat. Ringing Mode
Senli Guo, Ph.D.
Application Scientist, Bruker
Expand on the unique strengths of PeakForce QNM to provide enhanced adhesion property information that is complementary to existing mechanical and structural data.
On-Demand Session | 20 Minutes
Live Demonstration feat. nDMA
John Thornton
Sr. Application Scientist, Bruker
See how the first and only AFM-based viscoelastic technique that ties directly to bulk DMA works.
On-Demand Session | 20 Minutes
Live Demonstration feat. PeakForce Tapping
Ivan Yermolenko, Ph.D. Application Scientist, Bruker
Explore the latest PeakForce Tapping techniques and how High Accuracy QNM leverages bespoke probes and a barcode reader to improve accuracy and take the hassle out of calibration.
On-Demand Session | 20 Minutes
Live Demonstration feat. ssPFM
Senli Guo, Ph.D.
Application Scientist, Bruker
See a sneak peek at the new switching spectroscopy PFM, which allows to remove contact potential difference effects and quantify ferroelectric sample properties.
On-Demand Session | 20 Minutes
Live Demonstration feat. DataCube PFTUNA
Ivan Yermolenko, Ph.D.
Application Scientist, Bruker
Learn how the most popular electrical option is now even more useful when combined with DataCube mode, including how to characterize conductive samples in intermittent contact to preserve tip and sample.
On-Demand Session | 20 Minutes
Live Demonstration feat. KPFM
John Thornton
Sr. Application Scientist, Bruker
Overview of the many ways Bruker AFMs can perform surface potential measurements: AM/FM, tapping/ PFT, Lift Mode, or Single Pass.
