Materials Research Diffraction has Changed
Traditional X-ray diffraction involves the collection of a spectrum from randomly oriented powder samples for phase identification and quantification. Modern research often goes beyond this, measuring bulk effects such as residual stress and texture or the analysis of thin film coatings with X-ray reflectometry and grazing incidence diffraction. Traditionally, these techniques required the use of a floor standing diffractometer, but the D6 PHASER breaks this paradigm by bringing these analyses to a benchtop platform.
In this 3-part series of Live from the Lab we will explore the power, versatility, and accessibility of the D6 PHASER benchtop platform. This episode focuses on versatility, specifically in adapting the D6 PHASER for materials research measurements. We will focus on the universal stage which allows decoupling of the incident and diffracted angle enabling a wide range of materials research applications.