KEYWORDS: Atomic Force Microscopy; AFM; NanoWizard; Fluorescence Microscopy; Polymers; Oligomers; Alkalines; Alkaline Derivatives; Aromates; Polymer Research; Force Measurements; Correlative Microscopy
Atomic force microscopy (AFM) is a surface imaging technique based on a mechanical imaging process. Combining different imaging techniques with AFM saves time and leads to more reliable and meaningful scientific results. All modern contrast enhancing transmitted light techniques can be used with AFM, and all fluorescence microscopy techniques and polarized light applications are also available.
In this application note, AFM-based studies on samples made from alkanes, alkane derivatives, aromates, and polymers are presented. Information about the sample surface properties were obtained on a micrometer and nanometer range. Molecule assemblies were resolved up to the length of single molecules. Phase separation phenomena also were studied, not depending on the surface properties along. In the case of fluorescent samples, fluorescence microscopy was successfully combined with AFM.