Introduction of Thin Film Structure Analysis
Oct 14, 2021 | 3pm SGT
Join us for an informative webinar
Understanding thin film structures is one of the most important missions to modern material research. With advanced X-ray technologies, the details of the film structure can be revealed. The state-of-art D8 DISCOVER Plus XRD system has a long history of being an excellent material research tool for not only the bulk/powder specimens, but also the thin films. In this 60-min webinar, the following topics will be covered:
- What do we want to know about thin film structures?
- The X-ray technologies for thin film structure determination
- Grazing Incident Diffraction (GID)
- X-Ray Reflectivity (XRR)
- High-Resolution X-Ray Diffraction (HRXRD)
- Reciprocal Space Mapping (RSM)
- In-Plane Grazing Incident Diffraction (IP-GID)
- Thin film stress analysis
- How to make good X-ray measurements? Bruker’s solution to thin film analysis.
- The latest development update for Bruker's D8 DISCOVER Plus XRD system
Speaker
Wayne Lin
Business Development Manager, Thin Film Applications, Bruker AXS