EBSD map from material processed via additive manufacturing
EBSD map from material processed via additive manufacturing

EBSD Detectors 

Take Your EBSD Research Further with the Right Detector

Bruker has a range of different EBSD detectors available for use with its QUANTAX EBSD and QUANTAX ED-XS systems. Whether the focus is peforming ultra-fast and low kV EBSD, finding an accessible solution for everyday microanalysis or performing TKD or FSE/BSE imaging - Bruker has the right EBSD detector for you.

 

Here you can find information on all of our EBSD detectors. 

eWARP - Direct Electron Detection for Ultra-Fast, Low kV EBSD

eWARP is the pioneering EBSD detector that makes ultra-fast, low kV EBSD ordinary. 

Thanks to it's unique sensor, that works via direct electron detection, eWARP achieves industry-leading levels of signal efficency. This in turn facilitates fast, high-resolution imaging in a way never seen before.    

Discover eWARP and enter the new era of EBSD. 

eWARP - the revolutionary new EBSD detector that works via direct electron detection. 

eFlash XS - Routine EBSD Analysis using a Desktop SEM 

The eFlash XS Detector is a compact EBSD detector designed for seamless integration with desktop scanning electron microscopes (SEMs).

Its small footprint and efficient design make it well-suited for routine electron backscatter diffraction (EBSD) analysis, providing reliable crystallographic data with minimal setup. Optimized for ease of use, the eFlash XS enables accessible and efficient EBSD measurements, making it a practical choice for routine materials characterization in research and industry.

The eFlash XS is an EBSD detector in a compact package, designed for integration with desktop SEMs.

eFlash with OPTIMUS 2 - On-Axis TKD for Nanomaterials Analysis

The eFLASH Detector with OPTIMUS 2 is an advanced EBSD detector designed for high-resolution nanomaterial analysis.

This detector enhances pattern quality and accuracy, enabling precise characterization of complex materials at the nanoscale. Ideal for research and industrial applications, the detector provides reliable data for studying fine-grained structures, thin films, and other challenging samples.

eFlash EBSD detector with OPTIMUS 2 head for on-axis TKD. 

eFlash with ARGUS - FSE/BSE Imaging for Advanced Materials Microanalysis

The ARGUS detector head equips our eFlash detector with the ability to perform FSE and BSE imaging.

ARGUS is engineered to efficiently capture forescattered and backscattered electrons, thereby revealing detailed surface topography and compositional variations in samples. The detector head integrates advanced sensor technology with robust electronics, ensuring rapid image acquisition and enhanced contrast.

ARGUS detector head for FSE/BSE imaging on the eFlash detector. 

QUANTAX EBSD - Complete Analytical System for EBSD 

QUANTAX EBSD is a complete analytical system that provides users with everything they need to perform EBSD on their scanning electron microscope. 

QUANTAX EBSD includes:

  • An eWARP detector or eFlash EBSD Detector. 
  • ESPRIT software.
  • Optional OPTIMUS 2 detector extensison for on-axis TKD.
  • Optional ARGUS detector extension for FSE/BSE imaging.
QUANTAX EBSD - A complete analytical system for EBSD, including an EBSD detector, hardware and sofware.