Atomic Force Microscopy

Correlative AFM and STED Microscopy

Gain deeper insights into your sample

Combined AFM and STED microscopy - the perfect match

Atomic Force Microscopy (AFM) is ideally suited for combining with super-resolution microscopy techniques such as Stimulation Depletion Emission (STED) microscopy. Both techniques address similar nanometer resolutions in biological samples and each comes with its own individual advantages. Whereas an AFM can manipulate and determine physical and chemical properties of surfaces, e.g. of a cell, a STED microscope can monitor biochemical processes, such as chemical recognition, inside the cell. The combination of these two techniques therefore delivers complementary data and provides a deeper insight into the specimen under investigation.

  • Correlate topographical data with mechanical and bio-chemical cellular information
  • Stimulate cells and tissues mechanically with AFM and monitor the cell response with STED in real-time
  • Perform fast and high-resolution AFM/STED measurements with outstanding integration

 

The videos show (1) STED images of living human skin fibroblasts responding to mechanical stimuli being applied with a force of 10nN via AFM, and (2) real-time AFM manipulation of microtubules making them bend or (3) rupture (move the mouse over the movie and click the forward button to browse the videos).

Perfect integration and powerful software enable easy data acquision

The integration of AFM with optical microscopy is our key area of expertise. Bruker's NanoWizard® AFMs are compatible with the inverted microscopes of all major manufacturers and with advanced optical techniques such as STED and the microscopes from Abberior Instruments.

Our patented DirectOverlay software feature provides true correlative microscopy by enabling the perfect overlay of optical and AFM data with sub-diffraction limit precision.


The image shows human skin fibroblasts microtubules, imaged with STED and overlaid with the AFM topography image. Scan size 12.5 µm x 9 µm, height range 1 µm. Sample courtesy: Abberior Instruments GmbH.

Bruker's intuitive QI mode makes AFM easy and delivers high resolution surface topography images while simultaneously determining mechanical characteristics of the surface such as elasticity and adhesion.

The images show (A) a STED image of the actin filaments of living fibroblast cells, (B) an AFM image of the topography and (C) the 3D topography image overlaid with Young’s Modulus. Scan size 15 µm x 15 µm, height range 0.7 µm, Young’s Modulus range 90 kPa. Sample courtesy: Abberior Instruments GmbH.

Correlative AFM/STED - Benefits

  • Complementary information provides enhanced data
  • Real-time monitoring of cell/tissue dynamics in response to mechanical stimuli
  • Live tracking of changes in topography, adhesion, elasticity and other nanomechanical properties while simultaneously performing STED measurements
  • Perfect overlay of STED and AFM data with sub-diffraction limit precision via DirectOverlay
  • True correlative multi-parameter microscopy by means of the intuitive QI mode
  • Seamless integration of all NanoWizard® AFMs with STED microscopes such as the Expert Line and Compact Line from Abberior Instruments


Visit us at the BioAFM Demo Labs in Berlin for demonstrations of simultaneous confocal, STED and AFM techniques, or contact us for more information.