Qualifying Surface and Device Performance Through Roughness Quantification

       _{PRESENTATION HIGHLIGHTS:}

• [00:04:05] Selecting a roughness measurement method given the intended application
• [00:07:39] When to use areal vs. profile methods
• [00:10:37] Why to assess surface roughness via areal methods in accordance with ISO 25178
• [00:18:09] Selecting the best-fit instrument for areal roughness measurement (why select WLI)
• [00:29:31] How to pick the ideal filter cutoff
• [00:31:51] Case Studies - Picking the most relevant roughness parameter(s)

       _{LIVE AUDIENCE Q&A:}

• [00:55:22] How to know what role a parameter plays related to surface or device efficiency?
• [00:57:16] What parameter would you use to correlate adhesion with efficiency/performance?
• [00:58:50] How to compare before- and after-service measures for volumentric parameters?
• [01:02:02] What is the value of v parameters for quantifying asperities on a surface?
• [01:03:07] What is true lateral resolution when the objective is set to 0.5x optical resolution?
• [01:03:51] Can focus variation correlate roughness and functionality?
• [01:04:40] When is scanning WLI best for correlating roughness and functionality?
• [01:05:34] How many of the examples shown are compliant with ISO 25178?