Stylus Profiling Metrology for Soft Matter: Film Thickness and Depth for Flexible Electronic and Microfluidic Devices
Learn how to collect accurate and repeatable thickness and depth measurements of fragile thin film surfaces using advanced stylus profiler techniques
PRESENTATION HIGHLIGHTS:
- [00:00:00] Introduction to the speaker and Bruker's solutions for measuring film thickness
- [00:04:18] Understanding the importance of thin & soft material layers in context
- [00:07:44] Which technique to choose for thickness measurements of these materials?
- [00:11:56] Demonstrating how effective stylus profilers are for thickness measurements
- [00:20:37] How to ensure measurements of soft matter are accurate (with examples)
- [00:37:01] How researchers use stylus profilers: Case studies & practical considerations
- [00:43:50] Conclusion
- [00:46:04] Can you use stylus profilers to measure a non-flexible silicone-coated surface?
- [00:47:30] Is large stylus better for soft matter?
- [00:50:15] Why not use WLI? Could WLI or LSM be used to check for damage from a stylus tool?
- [00:52:53] How does one line up the stylus with the center of the film?
- [00:56:30] Is it possible to measure thin films by contact methods?
- [00:57:59] Was the wobbling seen at the 1 nm step surface roughness or background noise?
- [00:58:44] Is there any particular scan length needed to correctly measure sample thickness?
- [01:01:08] How do you determine the best scan range for samples with different thicknesses?
- [01:03:27] How do we know which stylus and scan length to use to measure roughness?
